Hirono; Masatoshi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hirono; Masatoshi.The latest application filed is for "lidar system".
Company Profile
2.21.30
- Hirono; Masatoshi - Yokohama JP
- Hirono; Masatoshi - Yokohama Kanagawa JP
- Hirono; Masatoshi - Kanagawa JP
- Hirono; Masatoshi - Masatoshi JP
- HIRONO; Masatoshi - Yokohama-shi JP
- Hirono; Masatoshi - Kanagawa-ken JP
- Hirono; Masatoshi - Tokyo JP
- Hirono; Masatoshi - Minato-ku Tokyo
- Hirono; Masatoshi - Chiba-ken JP
Patent Activity
| Patent | Date |
|---|---|
| Transmitting device, receiving device, and quantum key distribution system Grant 11,387,992 - Kikawada , et al. July 12, 2 | 2022-07-12 |
| Lidar System App 20220107397 - HIRONO; Masatoshi ; et al. | 2022-04-07 |
| Distance Measurement Device App 20220065998 - HIRONO; Masatoshi ; et al. | 2022-03-03 |
| Distance measuring device and distance measuring method Grant 10,816,663 - Ota , et al. October 27, 2 | 2020-10-27 |
| Quantum communication system, transmitting apparatus, and receiving apparatus Grant 10,630,392 - Kikawada , et al. | 2020-04-21 |
| Quantum Communication System, Transmitting Apparatus, And Receiving Apparatus App 20200067601 - KIKAWADA; Masakazu ; et al. | 2020-02-27 |
| Inspection method and inspection apparatus Grant 10,410,335 - Ogawa , et al. Sept | 2019-09-10 |
| Transmitting Device, Receiving Device, And Quantum Key Distribution System App 20190222415 - KIKAWADA; Masakazu ; et al. | 2019-07-18 |
| Inspection apparatus Grant 10,197,507 - Ogawa , et al. Fe | 2019-02-05 |
| Inspection Method And Inspection Apparatus App 20180293724 - Ogawa; Riki ; et al. | 2018-10-11 |
| Inspection method and inspection apparatus Grant 10,007,980 - Ogawa , et al. June 26, 2 | 2018-06-26 |
| Distance Measuring Device And Distance Measuring Method App 20180128918 - OTA; Yutaka ; et al. | 2018-05-10 |
| Inspection Method And Inspection Apparatus App 20180075595 - Ogawa; Riki ; et al. | 2018-03-15 |
| Inspection method and inspection apparatus Grant 9,846,928 - Ogawa , et al. December 19, 2 | 2017-12-19 |
| LED lighting device Grant 9,746,140 - Ohno , et al. August 29, 2 | 2017-08-29 |
| Defect inspection device Grant 9,683,947 - Hirono , et al. June 20, 2 | 2017-06-20 |
| Light beam scanner Grant 9,436,001 - Shiratsuchi , et al. September 6, 2 | 2016-09-06 |
| Defect Inspection Device App 20160209333 - HIRONO; Masatoshi ; et al. | 2016-07-21 |
| Projector and portable terminal Grant 9,372,389 - Hirono , et al. June 21, 2 | 2016-06-21 |
| Light Beam Scanner App 20150378150 - SHIRATSUCHI; Masataka ; et al. | 2015-12-31 |
| Pattern Test Apparatus App 20150377800 - OGAWA; Riki ; et al. | 2015-12-31 |
| Pattern test apparatus Grant 9,157,870 - Ogawa , et al. October 13, 2 | 2015-10-13 |
| Led Lighting Device App 20150192258 - Ohno; Hiroshi ; et al. | 2015-07-09 |
| Projector And Portable Terminal App 20140333906 - Hirono; Masatoshi ; et al. | 2014-11-13 |
| Inspection Method And Inspection Apparatus App 20140232849 - OGAWA; Riki ; et al. | 2014-08-21 |
| Inspection Apparatus App 20140204202 - OGAWA; Riki ; et al. | 2014-07-24 |
| Pattern Test Apparatus App 20140055780 - OGAWA; Riki ; et al. | 2014-02-27 |
| Photomask inspection method Grant 8,229,206 - Hirono July 24, 2 | 2012-07-24 |
| Pattern Inspection Apparatus App 20120081538 - Ogawa; Riki ; et al. | 2012-04-05 |
| Automatic focus adjusting mechanism and optical image acquisition apparatus Grant 8,004,655 - Shiratsuchi , et al. August 23, 2 | 2011-08-23 |
| Mask blank for EUV exposure and mask for EUV exposure Grant 7,935,460 - Hirono May 3, 2 | 2011-05-03 |
| Lighting optical apparatus and sample inspection apparatus Grant 7,863,588 - Hirono January 4, 2 | 2011-01-04 |
| Automatic Focus Adjusting Mechanism And Optical Image Acquisition Apparatus App 20100247085 - Shiratsuchi; Masataka ; et al. | 2010-09-30 |
| Photomask Inspection Method App 20100074512 - HIRONO; Masatoshi | 2010-03-25 |
| Optical quantizing unit and optical A/D converter Grant 7,671,771 - Hirono , et al. March 2, 2 | 2010-03-02 |
| Lighting system having lenses for light sources emitting rays at different wavelengths Grant 7,648,256 - Shiratsuchi , et al. January 19, 2 | 2010-01-19 |
| Mask Blank For Euv Exposure And Mask For Euv Exposure App 20090075184 - HIRONO; Masatoshi | 2009-03-19 |
| Optical quantizing unit and optical a/d converter App 20080297391 - Hirono; Masatoshi ; et al. | 2008-12-04 |
| Optical quantizing unit and optical A/D converter App 20080266154 - Hirono; Masatoshi ; et al. | 2008-10-30 |
| Lighting Optical Apparatus And Sample Inspection Apparatus App 20080237489 - HIRONO; Masatoshi | 2008-10-02 |
| Mask Pattern Inspection Apparatus With Koehler Illumination System Using Light Source Of High Spatial Coherency App 20080204737 - OGAWA; Riki ; et al. | 2008-08-28 |
| Optical quantizing unit and optical A/D converter Grant 7,403,142 - Hirono , et al. July 22, 2 | 2008-07-22 |
| Optical quantizing unit and optical A/D converter Grant 7,403,143 - Hirono , et al. July 22, 2 | 2008-07-22 |
| Optical quantizing unit and optical A/D converter App 20080094263 - Hirono; Masatoshi ; et al. | 2008-04-24 |
| Optical-pickup Head Device, And Method And Apparatus For Reproducing Optical Storage Medium App 20070201324 - Hirono; Masatoshi | 2007-08-30 |
| Optical quantizing unit and optical A/D converter App 20070166044 - Hirono; Masatoshi ; et al. | 2007-07-19 |
| Lighting System App 20070147041 - Shiratsuchi; Masataka ; et al. | 2007-06-28 |
| Optical recording medium, method for reproducing information and optical information reproducing apparatus App 20070077522 - Satoh; Yasuhiro ; et al. | 2007-04-05 |
| Optical disc recording and/or reproducing apparatus and optical pickup cooling method of optical disc recording and/or reproducing apparatus App 20070074230 - Yaoita; Akiko ; et al. | 2007-03-29 |
| Optical information recording method and optical information recording and reproducing apparatus utilizing holography App 20060176799 - Hirono; Masatoshi | 2006-08-10 |
| Optical recording/reproducing apparatus Grant 5,946,282 - Hirono , et al. August 31, 1 | 1999-08-31 |
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