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name:-0.0060098171234131
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Hironaga; Nobuo Patent Filings

Hironaga; Nobuo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hironaga; Nobuo.The latest application filed is for "three-dimensional memory device containing annular etch-stop spacer and method of making thereof".

Company Profile
1.5.6
  • Hironaga; Nobuo - Yokkaichi JP
  • Hironaga; Nobuo - Yamagata JP
  • Hironaga; Nobuo - Tokyo JP
  • Hironaga; Nobuo - Kanagawa JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Three-dimensional memory device containing annular etch-stop spacer and method of making thereof
Grant 10,242,994 - Inomata , et al.
2019-03-26
Three-dimensional Memory Device Containing Annular Etch-stop Spacer And Method Of Making Thereof
App 20180006049 - INOMATA; Takashi ;   et al.
2018-01-04
Set of stepped surfaces formation for a multilevel interconnect structure
Grant 9,502,429 - Hironaga November 22, 2
2016-11-22
Set Of Stepped Surfaces Formation For A Multilevel Interconnect Structure
App 20160148946 - HIRONAGA; Nobuo
2016-05-26
Semiconductor device manufacturing method, wafer treatment system, and recording medium
Grant 8,349,087 - Nambu , et al. January 8, 2
2013-01-08
Semiconductor device manufacturing method, wafer treatment system, and recording medium
App 20100184296 - Nambu; Hidetaka ;   et al.
2010-07-22
Semiconductor device and manufacturing method for the same
Grant 7,229,921 - Hironaga , et al. June 12, 2
2007-06-12
Semiconductor device fabricating method and treating liquid
Grant 6,890,864 - Aoki , et al. May 10, 2
2005-05-10
Semiconductor device and manufacturing method for the same
App 20030173671 - Hironaga, Nobuo ;   et al.
2003-09-18
Semiconductor device fabricating method and treating liquid
App 20030134507 - Aoki, Hidemitsu ;   et al.
2003-07-17
Semiconductor device fabricating method and treating liquid
App 20030027418 - Aoki, Hidemitsu ;   et al.
2003-02-06

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