Hirano; Katsunori

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hirano; Katsunori.The latest application filed is for "charged particle beam device and image processing method in charged particle beam device".

Company Profile

3.10.12

Hirano; Katsunori - Tokyo JP
Hirano; Katsunori - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Charged particle beam device and image processing method in charged particle beam device Grant 10,763,078 - Kamio , et al. Sep	2020-09-01
Charged Particle Beam Device And Image Processing Method In Charged Particle Beam Device App 20200066484 - KAMIO; Masato ; et al.	2020-02-27
Charged particle beam device and image processing method in charged particle beam device Grant 10,522,325 - Kamio , et al. Dec	2019-12-31
Charged Particle Beam Device And Image Processing Method In Charged Particle Beam Device App 20180301316 - KAMIO; Masato ; et al.	2018-10-18
Data processing device, semiconductor external view inspection device, and data volume increase alleviation method Grant 9,489,324 - Sakurai , et al. November 8, 2	2016-11-08
Data Processing Device, Semiconductor External View Inspection Device, And Data Volume Increase Alleviation Method App 20140372656 - Sakurai; Yuichi ; et al.	2014-12-18
Test apparatus Grant 8,304,726 - Hirano , et al. November 6, 2	2012-11-06
Semiconductor Wafer Testing Apparatus App 20110279143 - Toba; Tadanobu ; et al.	2011-11-17
Test Apparatus App 20110180708 - Hirano; Katsunori ; et al.	2011-07-28
Test apparatus Grant 7,952,072 - Hirano , et al. May 31, 2	2011-05-31
Method of diagnosing circuit board, circuit board, and CPU unit Grant 7,870,428 - Hirano , et al. January 11, 2	2011-01-11
DRAM stacked package, DIMM, and semiconductor manufacturing method Grant 7,546,506 - Sonoda , et al. June 9, 2	2009-06-09
Test Apparatus App 20090072138 - HIRANO; Katsunori ; et al.	2009-03-19
Apparatus Diagnosing Method, Apparatus Diagnosis Module, And Apparatus Mounted With Apparatus Diagnosis Module App 20080244329 - SHINBO; Kenichi ; et al.	2008-10-02
Method Of Diagnosing Circuit Board, Circuit Board, And Cpu Unit App 20080010533 - HIRANO; KATSUNORI ; et al.	2008-01-10
Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory Grant 7,137,055 - Hirano , et al. November 14, 2	2006-11-14
DRAM stacked package, DIMM, and semiconductor manufacturing method App 20060239055 - Sonoda; Yuji ; et al.	2006-10-26
Semiconductor device, and the method of testing or making of the semiconductor device Grant 7,114,110 - Kikuchi , et al. September 26, 2	2006-09-26
Optical modules and methods of making the optical modules Grant 6,979,810 - Chujo , et al. December 27, 2	2005-12-27
Semiconductor testing equipment, testing method for semiconductor, fabrication method of semiconductor, and semiconductor memory App 20050149803 - Hirano, Katsunori ; et al.	2005-07-07
Optical modules and methods of making the optical modules App 20040067068 - Chujo, Norio ; et al.	2004-04-08
Semiconductor device, and the method of testing or making of the semiconductor device App 20030210069 - Kikuchi, Shuji ; et al.	2003-11-13

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