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Patent applications and USPTO patent grants for Hiramatsu; Tomonobu.The latest application filed is for "test system for improving throughout or maintenance properties of semiconductor testing".
Patent | Date |
---|---|
Test system for improving throughout or maintenance properties of semiconductor testing Grant 9,400,307 - Tamura , et al. July 26, 2 | 2016-07-26 |
Test System for Improving Throughout or Maintenance Properties of Semiconductor Testing App 20140266282 - Tamura; Hiroshi ;   et al. | 2014-09-18 |
Switching matrix apparatus for semiconductor characteristic measurement apparatus App 20050275405 - Hiramatsu, Tomonobu | 2005-12-15 |
Capacitance measurement system App 20040160231 - Iwasaki, Yukoh ;   et al. | 2004-08-19 |
Method of determining measuring time for an analog-digital converter App 20020030616 - Hiramatsu, Tomonobu ;   et al. | 2002-03-14 |
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