Hiraide; Takahisa

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hiraide; Takahisa.The latest application filed is for "writing circuit, semiconductor integrated circuit and writing method".

Company Profile

0.11.11

Hiraide; Takahisa - Yokohama N/A JP
Hiraide; Takahisa - Kawasaki JP
Hiraide; Takahisa - Shinjuku JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Writing circuit, semiconductor integrated circuit and writing method Grant 8,644,093 - Hiraide February 4, 2	2014-02-04
Writing Circuit, Semiconductor Integrated Circuit And Writing Method App 20130039114 - HIRAIDE; Takahisa	2013-02-14
Method and apparatus for identifying paths having appropriate lengths for fault simulation Grant 8,166,380 - Hiraide April 24, 2	2012-04-24
Integrated circuit and method for testing the circuit Grant 8,081,528 - Hiraide December 20, 2	2011-12-20
Pseudorandom number generator, semiconductor integrated circuit, pseudorandom number generator control apparatus, pseudorandom number generator control method, and computer product Grant 7,895,492 - Hiraide , et al. February 22, 2	2011-02-22
Semiconductor integrated circuit, test data generating device, LSI test device, and computer product Grant 7,761,761 - Matsuo , et al. July 20, 2	2010-07-20
Semiconductor integrated circuit, test data generating device, LSI test device, and computer product Grant 7,757,138 - Matsuo , et al. July 13, 2	2010-07-13
Testing apparatus and testing method for an integrated circuit, and integrated circuit Grant 7,734,973 - Hiraide , et al. June 8, 2	2010-06-08
Integrated Circuit And Method For Testing The Circuit App 20090245001 - HIRAIDE; Takahisa	2009-10-01
Pseudorandom number generator, semiconductor integrated circuit, pseudorandom number generator control apparatus, pseudorandom number generator control method, and computer product App 20080222474 - Hiraide; Takahisa ; et al.	2008-09-11
Apparatus and method for diagnosing integrated circuit Grant 7,337,379 - Hiraide February 26, 2	2008-02-26
Semiconductor integrated circuit, test data generating device, lsi test device, and computer product App 20070288819 - Matsuo; Tatsuru ; et al.	2007-12-13
Semiconductor integrated circuit, test data generating device, lsi test device, and computer product App 20070288821 - Matsuo; Tatsuru ; et al.	2007-12-13
Method and apparatus for identifying paths having appropriate lengths for fault simulation App 20070245197 - Hiraide; Takahisa	2007-10-18
Device and method for testing integrated circuit Grant 7,266,746 - Hiraide September 4, 2	2007-09-04
Testing apparatus and testing method for an integrated circuit, and integrated circuit App 20070168816 - Hiraide; Takahisa ; et al.	2007-07-19
Testing apparatus and testing method for an integrated circuit, and integrated circuit Grant 7,178,078 - Hiraide , et al. February 13, 2	2007-02-13
Device and method for testing integrated circuit App 20050149804 - Hiraide, Takahisa	2005-07-07
Apparatus and method for diagnosing integrated circuit, and integrated circuit App 20030229838 - Hiraide, Takahisa	2003-12-11
Testing apparatus and testing method for an integrated circuit, and integrated circuit App 20020124217 - Hiraide, Takahisa ; et al.	2002-09-05

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