Hirai; Miho
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hirai; Miho.The latest application filed is for "semiconductor device featuring probe area definition mark for defining probe area in electrode pad, and proof test system for proving proper contact of test probe with probe area".
- Hirai; Miho - Kanagawa JP
- Hirai; Miho - Kawasaki JP
| Patent | Date |
|---|---|
| Semiconductor device including multiple rows of peripheral circuit units Grant 7,595,561 - Ichikawa , et al. September 29, 2 | 2009-09-29 |
| Semiconductor testing device Grant 7,518,242 - Hirai April 14, 2 | 2009-04-14 |
| Semiconductor device with electrode pads for test probe Grant 7,282,940 - Hirai October 16, 2 | 2007-10-16 |
| Semiconductor device featuring probe area definition mark for defining probe area in electrode pad, and proof test system for proving proper contact of test probe with probe area App 20060170105 - Hirai; Miho | 2006-08-03 |
| Semiconductor device including multiple rows of peripheral circuit units App 20060157856 - Ichikawa; Shingo ; et al. | 2006-07-20 |
| Semiconductor device App 20050116338 - Hirai, Miho | 2005-06-02 |
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