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Patent applications and USPTO patent grants for Hirabayashi; Yoshinao.The latest application filed is for "mapping-projection-type electron beam apparatus for inspecting sample by using electrons emitted from the sample".
Patent | Date |
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Mapping-projection-type electron beam apparatus for inspecting sample by using electrons emitted from the sample Grant 8,124,933 - Watanabe , et al. February 28, 2 | 2012-02-28 |
Mapping-projection-type Electron Beam Apparatus For Inspecting Sample By Using Electrons Emitted From The Sample App 20100019149 - WATANABE; Kenji ;   et al. | 2010-01-28 |
Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sample Grant 7,592,586 - Watanabe , et al. September 22, 2 | 2009-09-22 |
Mapping-projection-type electron beam apparatus for inspecting sample by using electrons reflected from the sample App 20060237646 - Watanabe; Kenji ;   et al. | 2006-10-26 |
Plate type heat exchanger App 20030010483 - Ikezaki, Yasuo ;   et al. | 2003-01-16 |
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