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Patent applications and USPTO patent grants for HIMANSHU;.The latest application filed is for "test circuit for dynamic checking for faults on functional and bist clock paths to memory in both atpg and lbist modes".
Patent | Date |
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Test Circuit For Dynamic Checking For Faults On Functional And Bist Clock Paths To Memory In Both Atpg And Lbist Modes App 20200333399 - SRINIVASAN; Venkata Narayanan ;   et al. | 2020-10-22 |
Test circuit for dynamic checking for faults on functional and BIST clock paths to memory in both ATPG and LBIST modes Grant 10,802,077 - Srinivasan , et al. October 13, 2 | 2020-10-13 |
Methods and systems for detecting and transferring defect information during manufacturing processes Grant 10,560,369 - Himanshu Feb | 2020-02-11 |
Methods And Systems For Detecting And Transferring Defect Information During Manufacturing Processes App 20170373965 - Himanshu; | 2017-12-28 |
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