loadpatents
name:-0.024919033050537
name:-0.016694068908691
name:-0.0010778903961182
Higurashi; Hitoshi Patent Filings

Higurashi; Hitoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Higurashi; Hitoshi.The latest application filed is for "charged particle beam writing apparatus and charged particle beam writing method".

Company Profile
0.11.14
  • Higurashi; Hitoshi - Yokohama JP
  • Higurashi; Hitoshi - Yokohama-shi JP
  • Higurashi; Hitoshi - Kanagawa JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Charged particle beam writing apparatus and charged particle beam writing method
Grant 9,734,981 - Gomi , et al. August 15, 2
2017-08-15
Charged Particle Beam Writing Apparatus And Charged Particle Beam Writing Method
App 20160300687 - GOMI; Saori ;   et al.
2016-10-13
Charged Particle Beam Drawing Apparatus And Electrical Charging Effect Correction Method Thereof
App 20130032707 - NAKAYAMADA; Noriaki ;   et al.
2013-02-07
Charged Particle Beam Writing Apparatus And Charged Particle Beam Writing Method
App 20120286174 - GOMI; Saori ;   et al.
2012-11-15
Apparatus and method for inspecting overlapping figure, and charged particle beam writing apparatus
Grant 8,280,632 - Sakamoto , et al. October 2, 2
2012-10-02
Charged particle beam drawing apparatus and proximity effect correction method thereof
Grant 8,207,514 - Hara , et al. June 26, 2
2012-06-26
Charged particle beam drawing method and apparatus
Grant 8,188,449 - Shibata , et al. May 29, 2
2012-05-29
Charged Particle Beam Drawing Apparatus And Electrical Charging Effect Correction Method Thereof
App 20110121208 - NAKAYAMADA; Noriaki ;   et al.
2011-05-26
Data verification method, charged particle beam writing apparatus, and computer-readable storage medium with program
Grant 7,949,966 - Anpo , et al. May 24, 2
2011-05-24
Charged Particle Beam Drawing Apparatus And Proximity Effect Correction Method Thereof
App 20110068281 - HARA; Shigehiro ;   et al.
2011-03-24
Charged Particle Beam Drawing Method And Apparatus
App 20110012031 - Shibata; Hayato ;   et al.
2011-01-20
Charged-particle beam pattern writing method and apparatus with a pipeline process to transfer data
Grant 7,786,453 - Sakamoto , et al. August 31, 2
2010-08-31
Charged particle beam lithography apparatus and charged particle beam lithography method
Grant 7,750,324 - Oogi , et al. July 6, 2
2010-07-06
Writing error verification method of pattern writing apparatus and generation apparatus of writing error verification data for pattern writing apparatus
Grant 7,698,682 - Anpo , et al. April 13, 2
2010-04-13
Creation method and conversion method of charged particle beam writing data, and writing method of charged particle beam
Grant 7,592,611 - Kasahara , et al. September 22, 2
2009-09-22
Apparatus And Method For Inspecting Overlapping Figure, And Charged Particle Beam Writing Apparatus
App 20090216450 - Sakamoto; Shinji ;   et al.
2009-08-27
Method of forming pattern writing data by using charged particle beam
Grant 7,504,645 - Anpo , et al. March 17, 2
2009-03-17
Charged Particle Beam Lithography Apparatus And Charged Particle Beam Lithography Method
App 20090057575 - OOGI; Susumu ;   et al.
2009-03-05
Data Verification Method, Charged Particle Beam Writing Apparatus, And Computer-readable Storage Medium With Program
App 20080221816 - Anpo; Akihito ;   et al.
2008-09-11
Writing Error Verification Method Of Pattern Writing Apparatus And Generation Apparatus Of Writing Error Verification Data For Pattern Writing Apparatus
App 20080046787 - ANPO; Akihito ;   et al.
2008-02-21
Charged-particle Beam Pattern Writing Method And Apparatus
App 20080023655 - SAKAMOTO; Shinji ;   et al.
2008-01-31
Method Of Forming Pattern Writing Data By Using Charged Particle Beam
App 20070226675 - ANPO; Akihito ;   et al.
2007-09-27
Creation Method And Conversion Method Of Charged Particle Beam Writing Data, And Writing Method Of Charged Particle Beam
App 20070053242 - Kasahara; Jun ;   et al.
2007-03-08
Method for generating exposure data for lithographic apparatus
Grant 6,047,116 - Murakami , et al. April 4, 2
2000-04-04

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