Higuchi; Akifusa
Patent Applications and Registrations
Patent applications and USPTO patent grants for Higuchi; Akifusa.The latest application filed is for "x-ray inspection device".
- Higuchi; Akifusa - Tokyo JP
| Patent | Date |
|---|---|
| X-ray inspection device Grant 11,079,345 - Matsushima , et al. August 3, 2 | 2021-08-03 |
| X-ray Inspection Device App 20210063326 - Matsushima; Naoki ; et al. | 2021-03-04 |
| X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve Grant 10,876,978 - Ogata , et al. December 29, 2 | 2020-12-29 |
| X-ray thin film inspection device Grant 10,473,598 - Ogata , et al. Nov | 2019-11-12 |
| X-ray Inspecting Device, X-ray Thin Film Inspecting Method, And Method For Measuring Rocking Curve App 20190227005 - Ogata; Kiyoshi ; et al. | 2019-07-25 |
| X-ray Thin Film Inspection Device App 20170234814 - Ogata; Kiyoshi ; et al. | 2017-08-17 |
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