loadpatents
Patent applications and USPTO patent grants for Higashiwaki; Masataka.The latest application filed is for "semiconductor substrate, semiconductor element and method for producing semiconductor substrate".
Patent | Date |
---|---|
Semiconductor substrate, semiconductor element and method for producing semiconductor substrate Grant 11,264,241 - Kuramata , et al. March 1, 2 | 2022-03-01 |
Trench MOS Schottky diode Grant 11,081,598 - Sasaki , et al. August 3, 2 | 2021-08-03 |
Semiconductor element and crystalline laminate structure Grant 10,861,945 - Sasaki , et al. December 8, 2 | 2020-12-08 |
Trench MOS-type Schottky diode Grant 10,825,935 - Sasaki , et al. November 3, 2 | 2020-11-03 |
Semiconductor Substrate, Semiconductor Element And Method For Producing Semiconductor Substrate App 20200168460 - KURAMATA; Akito ;   et al. | 2020-05-28 |
Ga2o3-based Semiconductor Device App 20200144377 - HIGASHIWAKI; Masataka ;   et al. | 2020-05-07 |
Trench Mos Schottky Diode App 20200066921 - SASAKI; Kohei ;   et al. | 2020-02-27 |
Trench Mos-type Schottky Diode App 20190148563 - SASAKI; Kohei ;   et al. | 2019-05-16 |
Ga.sub.2O.sub.3-based semiconductor element Grant 10,249,767 - Sasaki , et al. | 2019-04-02 |
Semiconductor element, method for manufacturing same, semiconductor substrate, and crystal laminate structure Grant 10,230,007 - Sasaki , et al. | 2019-03-12 |
High voltage withstand Ga2O3-based single crystal schottky barrier diode Grant 10,199,512 - Sasaki , et al. Fe | 2019-02-05 |
Ga2O3 SEMICONDUCTOR ELEMENT App 20180350967 - SASAKI; Kohei ;   et al. | 2018-12-06 |
High Withstand Voltage Schottky Barrier Diode App 20180254355 - SASAKI; Kohei ;   et al. | 2018-09-06 |
Semiconductor Element And Production Method For Same App 20170288061 - SASAKI; Kohei ;   et al. | 2017-10-05 |
Semiconductor Element And Crystalline Laminate Structure App 20170278933 - SASAKI; Kohei ;   et al. | 2017-09-28 |
Semiconductor Element, Method For Manufacturing Same, Semiconductor Substrate, And Crystal Laminate Structure App 20170213918 - SASAKI; Kohei ;   et al. | 2017-07-27 |
Method for controlling donor concentration in Ga.sub.2O.sub.3-based and method for forming ohmic contact Grant 9,611,567 - Sasaki , et al. April 4, 2 | 2017-04-04 |
Ga2O3 SEMICONDUCTOR ELEMENT App 20160365418 - Sasaki; Kohei ;   et al. | 2016-12-15 |
Ga2o3-based Semiconductor Element App 20160300953 - Sasaki; Kohei ;   et al. | 2016-10-13 |
Ga.sub.2O.sub.3 semiconductor element Grant 9,461,124 - Sasaki , et al. October 4, 2 | 2016-10-04 |
Ga2O3 semiconductor element Grant 9,437,689 - Sasaki , et al. September 6, 2 | 2016-09-06 |
Ga2O3 SEMICONDUCTOR ELEMENT App 20160141372 - SASAKI; Kohei ;   et al. | 2016-05-19 |
METHOD OF FORMING HIGH-RESISTIVITY REGION IN Ga2O3-BASED SINGLE CRYSTAL, AND CRYSTAL LAMINATE STRUCTURE AND SEMICONDUCTOR ELEMENT App 20160042949 - SASAKI; Kohei ;   et al. | 2016-02-11 |
Method of forming Ga2O3-based crystal film and crystal multilayer structure Grant 9,245,749 - Sasaki , et al. January 26, 2 | 2016-01-26 |
METHOD FOR CONTROLLING DONOR CONCENTRATION IN Ga2O3 SINGLE CRYSTAL BODY, AND METHOD FOR FORMING OHMIC CONTACT App 20160002823 - SASAKI; Kohei ;   et al. | 2016-01-07 |
Method of Forming Ga2O3-Based Crystal Film and Crystal Multilayer Structure App 20150179445 - SASAKI; Kohei ;   et al. | 2015-06-25 |
Ga2O3 SEMICONDUCTOR ELEMENT App 20140217469 - Sasaki; Kohei ;   et al. | 2014-08-07 |
Ga2O3 SEMICONDUCTOR ELEMENT App 20140217471 - Sasaki; Kohei ;   et al. | 2014-08-07 |
Ga2O3 SEMICONDUCTOR ELEMENT App 20140217470 - Sasaki; Kohei ;   et al. | 2014-08-07 |
Ga2O3 SEMICONDUCTOR ELEMENT App 20140217405 - Sasaki; Kohei ;   et al. | 2014-08-07 |
Gan-based field effect transistor and production method therefor Grant 7,547,911 - Higashiwaki June 16, 2 | 2009-06-16 |
Gan-Based Field Effect Transistor and Production Method Therefor App 20070295990 - Higashiwaki; Masataka | 2007-12-27 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.