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Hiblot; Gaspard Patent Filings

Hiblot; Gaspard

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hiblot; Gaspard.The latest application filed is for "method for producing a through semiconductor via connection".

Company Profile
17.11.19
  • Hiblot; Gaspard - Leuven BE
  • Hiblot; Gaspard - Heverlee BE
  • Hiblot; Gaspard - Brignoud FR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method For Producing A Through Semiconductor Via Connection
App 20220270924 - La Tulipe; Douglas Charles ;   et al.
2022-08-25
Method Of Producing A Gate Cut In A Semiconductor Component
App 20220238388 - HIBLOT; Gaspard ;   et al.
2022-07-28
Electrode Arrangement, A Neural Probe, And A Method For Manufacturing An Electrode Arrangement
App 20220157704 - HIBLOT; Gaspard ;   et al.
2022-05-19
Integrated circuit with backside power delivery network and backside transistor
Grant 11,257,764 - Hiblot , et al. February 22, 2
2022-02-22
Method for Inducing Stress in Semiconductor Devices
App 20210408287 - Hiblot; Gaspard ;   et al.
2021-12-30
Vertical isolated gate field effect transistor integrated in a semiconductor chip
Grant 11,121,086 - Hiblot , et al. September 14, 2
2021-09-14
Method for bonding and interconnecting semiconductor chips
Grant 11,114,337 - Hiblot , et al. September 7, 2
2021-09-07
Stress sensor suitable for measuring mechanical stress in a layered metallization structure of a microelectronic component
Grant 11,038,067 - Hiblot , et al. June 15, 2
2021-06-15
Bipolar Selector Device For A Memory Array
App 20210143211 - Hiblot; Gaspard ;   et al.
2021-05-13
Bipolar Selector Device For A Memory Array
App 20210143213 - Hiblot; Gaspard ;   et al.
2021-05-13
Vertical Channel Device
App 20210134995 - Hiblot; Gaspard ;   et al.
2021-05-06
Semiconductor fin structures having silicided portions
Grant 10,998,413 - Hiblot , et al. May 4, 2
2021-05-04
Isolated Vertical Nanowire
App 20210074830 - Hiblot; Gaspard ;   et al.
2021-03-11
Self-aligned internal spacer with EUV
Grant 10,903,335 - Hiblot , et al. January 26, 2
2021-01-26
Integrated Circuit With Backside Power Delivery Network And Backside Transistor
App 20200373242 - Hiblot; Gaspard ;   et al.
2020-11-26
Semiconductor integrated circuit manufactured using a plasma-processing step
Grant 10,825,806 - Hiblot , et al. November 3, 2
2020-11-03
Method for producing a through semiconductor via connection
Grant 10,811,315 - Hiblot , et al. October 20, 2
2020-10-20
Low-temperature voltage reference using coulomb blockade mechanism
Grant 10,712,760 - Hiblot , et al.
2020-07-14
Vertical Isolated Gate Field Effect Transistor Integrated In A Semiconductor Chip
App 20200203276 - Hiblot; Gaspard ;   et al.
2020-06-25
Method For Bonding And Interconnecting Semiconductor Chips
App 20200203224 - Hiblot; Gaspard ;   et al.
2020-06-25
Semiconductor Fin Structures Having Silicided Portions
App 20200194567 - Hiblot; Gaspard ;   et al.
2020-06-18
Stress Sensor Suitable For Measuring Mechanical Stress In A Layered Metallization Structure Of A Microelectronic Component
App 20200152804 - Hiblot; Gaspard ;   et al.
2020-05-14
Stress sensor for semiconductor components
Grant 10,607,901 - Hiblot , et al.
2020-03-31
Method For Producing A Through Semiconductor Via Connection
App 20200006142 - Hiblot; Gaspard ;   et al.
2020-01-02
Low-Temperature Voltage Reference Using Coulomb Blockade Mechanism
App 20200004285 - Hiblot; Gaspard ;   et al.
2020-01-02
Self-Aligned Internal Spacer With EUV
App 20190348523 - Hiblot; Gaspard ;   et al.
2019-11-14
Semiconductor Integrated Circuit Manufactured Using A Plasma-processing Step
App 20190181133 - Hiblot; Gaspard ;   et al.
2019-06-13
Stress Sensor for Semiconductor Components
App 20190074231 - Hiblot; Gaspard ;   et al.
2019-03-07
High-sensitivity electronic detector
Grant 10,074,649 - Monfray , et al. September 11, 2
2018-09-11
High-sensitivity Electronic Detector
App 20170248543 - Monfray; Stephane ;   et al.
2017-08-31

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