Hetzer; David

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hetzer; David.The latest application filed is for "high-precision dispense system with meniscus control".

Company Profile

1.6.7

Hetzer; David - Schenectady NY
Hetzer; David - Dresden DE
Hetzer, David - Larchmont NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
High-precision dispense system with meniscus control Grant 10,354,872 - deVilliers , et al. July 16, 2	2019-07-16
High-Precision Dispense System With Meniscus Control App 20180047563 - deVilliers; Anton J. ; et al.	2018-02-15
EUV resist sensitivity reduction Grant 9,086,631 - Huli , et al. July 21, 2	2015-07-21
Track processing to remove organic films in directed self-assembly chemo-epitaxy applications Grant 8,975,009 - Somervell , et al. March 10, 2	2015-03-10
Euv Resist Sensitivity Reduction App 20140315135 - HULI; LIOR ; et al.	2014-10-23
Track Processing To Remove Organic Films In Directed Self-assembly Chemo-epitaxy Applications App 20140273472 - Somervell; Mark H. ; et al.	2014-09-18
Training a machine learning system to determine photoresist parameters Grant 7,949,618 - Bischoff , et al. May 24, 2	2011-05-24
Determining photoresist parameters using optical metrology Grant 7,728,976 - Bischoff , et al. June 1, 2	2010-06-01
Automated process control using optical metrology and photoresist parameters Grant 7,567,353 - Bischoff , et al. July 28, 2	2009-07-28
Determining photoresist parameters using optical metrology App 20080241974 - Bischoff; Joerg ; et al.	2008-10-02
Training a machine learning system to determine photoresist parameters App 20080243730 - Bischoff; Joerg ; et al.	2008-10-02
Automated process control using optical metrology and photoresist parameters App 20080241975 - Bischoff; Joerg ; et al.	2008-10-02
Offline data collection App 20020080158 - Storfer, Paul D. ; et al.	2002-06-27

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.