Hess; Carl

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hess; Carl.The latest application filed is for "methods and systems for inspection of wafers and reticles using designer intent data".

Company Profile

1.17.15

Hess; Carl - Los Altos CA
Hess; Carl - Loss Altos CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and systems for inspection of wafers and reticles using designer intent data Grant 11,348,222 - Marella , et al. May 31, 2	2022-05-31
Methods and systems for inspection of wafers and reticles using designer intent data Grant 10,713,771 - Marella , et al.	2020-07-14
Methods And Systems For Inspection Of Wafers And Reticles Using Designer Intent Data App 20200074619 - Marella; Paul Frank ; et al.	2020-03-05
Methods And Systems For Inspection Of Wafers And Reticles Using Designer Intent Data App 20180247403 - Marella; Paul Frank ; et al.	2018-08-30
System and method for detecting design and process defects on a wafer using process monitoring features Grant 9,710,903 - Fouquet , et al. July 18, 2	2017-07-18
Method and system for hybrid reticle inspection Grant 9,208,552 - Hess , et al. December 8, 2	2015-12-08
Methods and Systems for Inspection of Wafers and Reticles Using Designer Intent Data App 20150178914 - Marella; Paul Frank ; et al.	2015-06-25
Methods and systems for inspection of wafers and reticles using designer intent data Grant 9,002,497 - Volk , et al. April 7, 2	2015-04-07
Database-driven cell-to-cell reticle inspection Grant 8,914,754 - Hess , et al. December 16, 2	2014-12-16
Focus offset contamination inspection Grant 8,810,646 - Hess August 19, 2	2014-08-19
Method and System for Hybrid Reticle Inspection App 20130279792 - Hess; Carl ; et al.	2013-10-24
Database-Driven Cell-to-Cell Reticle Inspection App 20130111417 - Hess; Carl ; et al.	2013-05-02
Methods and systems for classifying defects detected on a reticle Grant 8,204,297 - Xiong , et al. June 19, 2	2012-06-19
Focus Offset Contamination Inspection App 20120086799 - Hess; Carl	2012-04-12
Methods for simulating reticle layout data, inspecting reticle layout data, and generating a process for inspecting reticle layout data Grant 8,151,220 - Hess , et al. April 3, 2	2012-04-03
Computer-implemented methods and systems for determining different process windows for a wafer printing process for different reticle designs Grant 8,102,408 - Verma , et al. January 24, 2	2012-01-24
Systems And Methods For Detecting Design And Process Defects On A Wafer, Reviewing Defects On A Wafer, Selecting One Or More Features Within A Design For Use As Process Monitoring Features, Or Some Combination Thereof App 20110276935 - Fouquet; Christophe ; et al.	2011-11-10
Computer-implemented methods for detecting defects in reticle design data Grant 7,646,906 - Saidin , et al. January 12, 2	2010-01-12
Process window optical proximity correction Grant 7,493,590 - Hess , et al. February 17, 2	2009-02-17
Methods And Systems For Inspection Of Wafers And Reticles Using Designer Intent Data App 20080081385 - Marella; Paul Frank ; et al.	2008-04-03
Computer-implemented Methods And Systems For Determining Different Process Windows For A Wafer Printing Process For Different Reticle Designs App 20080072207 - Verma; Gaurav ; et al.	2008-03-20
Computer-implemented methods for detecting defects in reticle design data App 20060236294 - Saidin; Zain K. ; et al.	2006-10-19
Computer-implemented methods, processors, and systems for creating a wafer fabrication process App 20060161452 - Hess; Carl	2006-07-20
Methods for simulating reticle layout data, inspecting reticle layout data, and generating a process for inspecting reticle layout data App 20060051682 - Hess; Carl ; et al.	2006-03-09
Methods and systems for inspection of wafers and reticles using designer intent data App 20050004774 - Volk, William ; et al.	2005-01-06

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.