loadpatents
name:-0.0043208599090576
name:-0.0034110546112061
name:-0.0070929527282715
HERES; Pieter Jacob Patent Filings

HERES; Pieter Jacob

Patent Applications and Registrations

Patent applications and USPTO patent grants for HERES; Pieter Jacob.The latest application filed is for "method of determining a mark measurement sequence, stage apparatus and lithographic apparatus".

Company Profile
5.3.5
  • HERES; Pieter Jacob - Veldhoven NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method Of Determining A Mark Measurement Sequence, Stage Apparatus And Lithographic Apparatus
App 20220260933 - NAGY; Istvan ;   et al.
2022-08-18
Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatus
Grant 10,901,326 - Hulsebos , et al. January 26, 2
2021-01-26
Method Of Controlling A Lithographic Apparatus And Device Manufacturing Method, Control System For A Lithographic Apparatus And
App 20200201194 - Hulsebos; Edo Maria ;   et al.
2020-06-25
Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatus
Grant 10,620,549 - Hulsebos , et al.
2020-04-14
Method Of Controlling A Lithographic Apparatus And Device Manufacturing Method, Control System For A Lithographic Apparatus And
App 20190265598 - HULSEBOS; Edo Maria ;   et al.
2019-08-29
Method of controlling a lithographic apparatus and device manufacturing method, control system for a lithographic apparatus and lithographic apparatus
Grant 10,331,040 - Hulsebos , et al.
2019-06-25
Method Of Controlling A Lithographic Apparatus And Device Manufacturing Method, Control System For A Lithographic Apparatus And Lithographic Apparatus
App 20180284621 - HULSEBOS; Edo Maria ;   et al.
2018-10-04
Method Of Calculating Model Parameters Of A Substrate, A Lithographic Apparatus And An Apparatus For Controlling Lithographic Processing By A Lithographic Apparatus
App 20120218533 - LYULINA; Irina ;   et al.
2012-08-30

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed