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Semiconductor memory devices and systems including data output circuits to output stored data during first output mode and output programmed data pattern during second output mode Grant 8,625,364 - Heo January 7, 2 | 2014-01-07 |
Semiconductor Memory Device And Methods Thereof App 20120230125 - HEO; Nak-Won | 2012-09-13 |
Semiconductor memory device with a data output circuit configured to output stored data during a first type of read operation and configured to output at least one data pattern during a second type of read operation and methods thereof Grant 8,199,588 - Heo June 12, 2 | 2012-06-12 |
Semiconductor memory device and methods thereof App 20090244986 - Heo; Nak-Won | 2009-10-01 |
Data output circuit and method in DDR synchronous semiconductor device Grant 7,558,127 - Heo , et al. July 7, 2 | 2009-07-07 |
Semiconductor memory device with a data output circuit configured to output stored data during a first type of read operation and configured to output at least one data pattern during a second type of read operation and methods thereof Grant 7,551,495 - Heo June 23, 2 | 2009-06-23 |
Semiconductor memory device with strengthened power and method of strengthening power of the same Grant 7,518,898 - Bae , et al. April 14, 2 | 2009-04-14 |
Semiconductor memory device and method of supplying wordline voltage thereof Grant 7,447,084 - Heo , et al. November 4, 2 | 2008-11-04 |
Data Output Circuit And Method In Ddr Synchronous Semiconductor Device App 20080225606 - HEO; Nak-Won ;   et al. | 2008-09-18 |
Semiconductor memory device with fail-bit storage unit and method for parallel bit testing App 20080215939 - Ahn; Ji-Hyun ;   et al. | 2008-09-04 |
Data output circuit and method in DDR synchronous semiconductor device Grant 7,376,021 - Heo , et al. May 20, 2 | 2008-05-20 |
Semiconductor Memory Device With Data And Local Redundancy Memory Cell Arrays, And Redundancy Method Thereof App 20080049526 - JUNG; Han-Gyun ;   et al. | 2008-02-28 |
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Semiconductor memory device and method of supplying wordline voltage thereof App 20060146616 - Heo; Nak-Won ;   et al. | 2006-07-06 |
Delay locked loop capable of compensating for delay of internal clock signal by variation of driving strength of output driver in semiconductor memory device Grant 7,068,084 - Byun , et al. June 27, 2 | 2006-06-27 |
Circuit for generating a data strobe signal used in a double data rate synchronous semiconductor device Grant 6,940,321 - Heo , et al. September 6, 2 | 2005-09-06 |
Information processing system with memory modules of a serial bus architecture Grant 6,839,786 - Kim , et al. January 4, 2 | 2005-01-04 |
Circuit for generating a data strobe signal used in a double data rate synchronous semiconductor device App 20040145962 - Heo, Nak-Won ;   et al. | 2004-07-29 |
Delay locked loop capable of compensating for delay of internal clock signal by variation of driving strength of output driver in semiconductor memory device App 20040124896 - Byun, Gyung-su ;   et al. | 2004-07-01 |
Data output circuit and method in DDR synchronous semiconductor device App 20040098551 - Heo, Nak-Won ;   et al. | 2004-05-20 |
Data output method and data output circuit for applying reduced precharge level Grant 6,717,448 - Heo , et al. April 6, 2 | 2004-04-06 |
Delay locked loop circuit and method having adjustable locking resolution Grant 6,621,315 - Heo , et al. September 16, 2 | 2003-09-16 |
Data output method and data output circuit for applying reduced precharge level App 20030094985 - Heo, Nak-won ;   et al. | 2003-05-22 |
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Information processing system with memory modules of a serial bus architecture App 20020194416 - Kim, Kyung-Ho ;   et al. | 2002-12-19 |