Heo; Kyung-Hoe

Patent Applications and Registrations

Patent applications and USPTO patent grants for Heo; Kyung-Hoe.The latest application filed is for "cell cutting device for display devices".

Company Profile

1.8.7

Heo; Kyung-Hoe - Yongin-si KR
Heo; Kyung-Hoe - Yongin KR
HEO; Kyung-Hoe - Yongin-City KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Cell cutting device for display devices Grant 10,456,939 - Heo , et al. Oc	2019-10-29
Cell Cutting Device For Display Devices App 20180133914 - HEO; Kyung-Hoe ; et al.	2018-05-17
Cell cutting device for display devices and method of manufacturing the display device Grant 9,931,757 - Heo , et al. April 3, 2	2018-04-03
Method for inspecting polysilicon layer Grant 9,464,991 - Voronov , et al. October 11, 2	2016-10-11
Method of measuring a silicon thin film, method of detecting defects in a silicon thin film, and silicon thin film defect detection device Grant 9,140,742 - Voronov , et al. September 22, 2	2015-09-22
Carrier substrate removing apparatus, display apparatus manufacturing system, and method of manufacturing the display apparatus Grant 9,010,398 - Kweon , et al. April 21, 2	2015-04-21
Method For Inspecting Polysilicon Layer App 20140353523 - VORONOV; Alexander ; et al.	2014-12-04
Carrier Substrate Removing Apparatus, Display Apparatus Manufacturing System, And Method Of Manufacturing The Display Apparatus App 20140138032 - Kweon; Jin-Keon ; et al.	2014-05-22
Device and method for inspecting polycrystalline silicon layer Grant 8,717,555 - Voronov , et al. May 6, 2	2014-05-06
Cell Cutting Device For Display Devices And Method Of Manufacturing The Display Device App 20140020542 - HEO; Kyung-Hoe ; et al.	2014-01-23
Method Of Measuring A Silicon Thin Film, Method Of Detecting Defects In A Silicon Thin Film, And Silicon Thin Film Defect Detection Device App 20130265078 - Voronov; Alexander ; et al.	2013-10-10
Device And Method For Inspecting Polycrystalline Silicon Layer App 20120057148 - VORONOV; Alexander ; et al.	2012-03-08

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