loadpatents
name:-0.020945072174072
name:-0.0084109306335449
name:-0.00059008598327637
Hennig; Mario Patent Filings

Hennig; Mario

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hennig; Mario.The latest application filed is for "method of patterning a substrate, photosensitive layer stack and system for lithography".

Company Profile
0.7.15
  • Hennig; Mario - Dresden DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for producing a mask for the lithographic projection of a pattern onto a substrate
Grant 7,644,389 - Hennig , et al. January 5, 2
2010-01-05
Method of Patterning a Substrate, Photosensitive Layer Stack and System for Lithography
App 20090170024 - Hennig; Mario ;   et al.
2009-07-02
Method for reducing an overlay error and measurement mark for carrying out the same
Grant 7,425,396 - Gruss , et al. September 16, 2
2008-09-16
Mask Structure for Manufacturing an Integrated Circuit by Photolithographic Patterning
App 20080204686 - Henke; Wolfgang ;   et al.
2008-08-28
Set of at least two masks for the projection of structure patterns
Grant 7,393,613 - Dettmann , et al. July 1, 2
2008-07-01
Set of masks including a first mask and a second trimming mask with a semitransparent region having a transparency between 20% and 80% to control diffraction effects and obtain maximum depth of focus for the projection of structure patterns onto a semiconductor wafer
Grant 7,393,614 - Kohle , et al. July 1, 2
2008-07-01
Apparatus for projecting a pattern into an image plane
Grant 7,339,652 - Moukara , et al. March 4, 2
2008-03-04
Transistor arrangement, sense-amplifier arrangement and methods of manufacturing the same via a phase shift mask
App 20080042171 - Mosler; Sebastian ;   et al.
2008-02-21
Mask arrangement, optical projection system and method for obtaining grating parameters and absorption properties of a diffractive optical element
App 20070287075 - Pforr; Rainer ;   et al.
2007-12-13
Method For Producing A Mask For The Lithographic Projection Of A Pattern Onto A Substrate
App 20070196744 - Hennig; Mario ;   et al.
2007-08-23
Method and system for photolithography
App 20070009816 - Pforr; Rainer ;   et al.
2007-01-11
Apparatus for projecting a pattern into an image plane
App 20060181691 - Moukara; Molela ;   et al.
2006-08-17
Imaging system and method for producing semiconductor structures on a wafer by imaging a mask on the wafer with a dipole diaphragm
App 20060183258 - Hennig; Mario ;   et al.
2006-08-17
Method for producing semiconductor patterns on a wafer
App 20060177773 - Hennig; Mario ;   et al.
2006-08-10
Mask with programmed defects and method for the fabrication thereof
Grant 7,045,254 - Dettmann , et al. May 16, 2
2006-05-16
Method for transferring a layout of an integrated circuit level to a semiconductor substrate
App 20050196689 - Nolscher, Christoph ;   et al.
2005-09-08
Method for reducing an overlay error and measurement mark for carrying out the same
App 20050069790 - Gruss, Stefan ;   et al.
2005-03-31
Photolithographic mask and methods for producing a structure and of exposing a wafer in a projection apparatus
Grant 6,838,216 - Griesinger , et al. January 4, 2
2005-01-04
Set of at least two masks for the projection of structure patterns and method for producing the masks
App 20040202943 - Dettmann, Wolfgang ;   et al.
2004-10-14
Set of masks for the projection of structure patterns onto a semiconductor wafer
App 20040197677 - Kohle, Roderick ;   et al.
2004-10-07
Photolithographic mask and methods for producing a structure and of exposing a wafer in a projection apparatus
App 20040038135 - Griesinger, Uwe ;   et al.
2004-02-26
Mask with programmed defects and method for the fabrication thereof
App 20030134206 - Dettmann, Wolfgang ;   et al.
2003-07-17

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