Hendler; Lawrence

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hendler; Lawrence.The latest application filed is for "automated model building and model updating".

Company Profile

0.9.9

Hendler; Lawrence - Cupertino CA
Hendler; Lawrence - Sunnyvale CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Automated Model Building And Model Updating App 20120303142 - Hendler; Lawrence ; et al.	2012-11-29
Automated model building and model updating Grant 8,271,103 - Hendler , et al. September 18, 2	2012-09-18
Process control using process data and yield data Grant 7,996,102 - Hendler , et al. August 9, 2	2011-08-09
Plasma Spraying and Recrystallization of Thick Film Layer App 20100304035 - Zehavi; Raanan ; et al.	2010-12-02
Self-correcting multivariate analysis for use in monitoring dynamic parameters in process environments Grant 7,809,450 - Lev-Ami , et al. October 5, 2	2010-10-05
Process Control Using Process Data And Yield Data App 20100100223 - Hendler; Lawrence ; et al.	2010-04-22
Manufacturing process end point detection Grant 7,630,786 - Hendler , et al. December 8, 2	2009-12-08
Process control using process data and yield data Grant 7,622,308 - Hendler , et al. November 24, 2	2009-11-24
Process Control Using Process Data and Yield Data App 20090228247 - Hendler; Lawrence ; et al.	2009-09-10
Automated Model Building and Model Updating App 20090037013 - Hendler; Lawrence ; et al.	2009-02-05
Manufacturing Process End Point Detection App 20080221720 - Hendler; Lawrence ; et al.	2008-09-11
Classifying faults associated with a manufacturing process App 20080010531 - Hendler; Lawrence ; et al.	2008-01-10
Method and apparatus for classifying manufacturing outputs Grant 7,313,454 - Hendler , et al. December 25, 2	2007-12-25
Method and apparatus for classifying manufacturing outputs App 20070129836 - Hendler; Lawrence ; et al.	2007-06-07
Self-correcting multivariate analysis for use in monitoring dynamic parameters in process environments App 20070021859 - Lev-Ami; Uzi Josef ; et al.	2007-01-25
High-speed, high-resolution, large area inspection using multiple optical fourier transform cells Grant 5,966,212 - Hendler , et al. October 12, 1	1999-10-12
Prober and tester with contact interface for integrated circuits-containing wafer held docked in a vertical plane Grant 5,656,942 - Watts , et al. August 12, 1	1997-08-12
Defect detection using fourier optics and a spatial separator for simultaneous optical computing of separated fourier transform components Grant 5,506,676 - Hendler , et al. April 9, 1	1996-04-09

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