loadpatents
name:-0.0084199905395508
name:-0.0050489902496338
name:-0.0028948783874512
Hendel; Rudolf Patent Filings

Hendel; Rudolf

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hendel; Rudolf.The latest application filed is for "apparatus and method for using scanning light beam for film or surface modification".

Company Profile
2.5.7
  • Hendel; Rudolf - Summit NJ
  • Hendel; Rudolf - Los Gatos CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Apparatus and method for using scanning light beam for film or surface modification
Grant 10,503,083 - Schattenburg , et al. Dec
2019-12-10
Apparatus And Method For Using Scanning Light Beam For Film Or Surface Modification
App 20190056675 - Schattenburg; Mark ;   et al.
2019-02-21
Detection of position, orientation and scale of work pieces using retroreflective surfaces
Grant 10,145,672 - Schattenburg , et al. De
2018-12-04
Apparatus and method for using scanning light beam for film or surface modification
Grant 10,108,096 - Schattenburg , et al. October 23, 2
2018-10-23
Detection Of Position, Orientation And Scale Of Work Pieces Using Retroreflective Surfaces
App 20180209780 - Schattenburg; Mark ;   et al.
2018-07-26
Using phase difference of interference lithography for resolution enhancement
Grant 8,582,079 - Liu , et al. November 12, 2
2013-11-12
Integrated Interference-assisted Lithography
App 20100002210 - HENDEL; RUDOLF ;   et al.
2010-01-07
Patterning Resolution Enhancement Combining Interference Lithography And Self-aligned Double Patterning Techniques
App 20090246706 - HENDEL; RUDOLF ;   et al.
2009-10-01
Resolution Enhancement Techniques Combining Interference-assisted Lithography With Other Photolithography Techniques
App 20090117491 - Hendel; Rudolf ;   et al.
2009-05-07
Resolution Enhancement Techniques Combining Four Beam Interference-assisted Lithography With Other Photolithography Techniques
App 20090111056 - Hendel; Rudolf ;   et al.
2009-04-30
Using Phase Difference Of Interference Lithography For Resolution Enhancement
App 20090046263 - Liu; Kuo-Shih ;   et al.
2009-02-19

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed