Hench; John

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hench; John.The latest application filed is for "visualization of three-dimensional semiconductor structures".

Company Profile

10.13.9

Hench; John - Los Gatos CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Computationally efficient x-ray based overlay measurement Grant 11,428,650 - Hench , et al. August 30, 2	2022-08-30
Visualization of three-dimensional semiconductor structures Grant 11,099,137 - Rosenberg , et al. August 24, 2	2021-08-24
Methods and systems for characterization of an x-ray beam with high spatial resolution Grant 11,073,487 - Bykanov , et al. July 27, 2	2021-07-27
On-device metrology using target decomposition Grant 10,983,227 - Hench , et al. April 20, 2	2021-04-20
Visualization of Three-Dimensional Semiconductor Structures App 20200393386 - Rosenberg; Aaron J. ; et al.	2020-12-17
Visualization of three-dimensional semiconductor structures Grant 10,794,839 - Rosenberg , et al. October 6, 2	2020-10-06
Visualization of Three-Dimensional Semiconductor Structures App 20200271595 - Rosenberg; Aaron J. ; et al.	2020-08-27
Phase revealing optical and X-ray semiconductor metrology Grant 10,677,586 - Hench , et al.	2020-06-09
Computationally Efficient X-ray Based Overlay Measurement App 20200116655 - Hench; John ; et al.	2020-04-16
Phase Revealing Optical and X-Ray Semiconductor Metrology App 20200080836 - Hench; John ; et al.	2020-03-12
Computationally efficient X-ray based overlay measurement Grant 10,545,104 - Hench , et al. Ja	2020-01-28
Calibration of a small angle X-ray scatterometry based metrology system Grant 10,481,111 - Hench , et al. Nov	2019-11-19
On-Device Metrology Using Target Decomposition App 20190049602 - Hench; John ; et al.	2019-02-14
Methods And Systems For Characterization Of An X-Ray Beam With High Spatial Resolution App 20180328868 - Bykanov; Alexander ; et al.	2018-11-15
Calibration Of A Small Angle X-Ray Scatterometry Based Metrology System App 20180113084 - Hench; John ; et al.	2018-04-26
Scatterometry-based imaging and critical dimension metrology Grant 9,494,535 - Sezginer , et al. November 15, 2	2016-11-15
Computationally Efficient X-ray Based Overlay Measurement App 20160320319 - Hench; John ; et al.	2016-11-03
Scatterometry-Based Imaging and Critical Dimension Metrology App 20150300965 - Sezginer; Abdurrahman ; et al.	2015-10-22
Measuring critical dimensions of a semiconductor structure Grant 8,798,966 - Hench , et al. August 5, 2	2014-08-05
Method for optimizing the configuration of a scatterometry measurement system Grant 7,826,072 - Wack , et al. November 2, 2	2010-11-02
Model-based measurement of semiconductor device features with feed forward use of data for dimensionality reduction Grant 7,716,003 - Wack , et al. May 11, 2	2010-05-11

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