Heist; Stefan
Patent Applications and Registrations
Patent applications and USPTO patent grants for Heist; Stefan.The latest application filed is for "device and method for spatially measuring surfaces".
- Heist; Stefan - Jena DE
| Patent | Date |
|---|---|
| Device and method for spatially measuring surfaces Grant 10,378,888 - Heist , et al. A | 2019-08-13 |
| Method and device for the contact-free measurement of surface contours Grant 10,302,421 - Heist , et al. | 2019-05-28 |
| Device And Method For Spatially Measuring Surfaces App 20180149472 - Heist; Stefan ; et al. | 2018-05-31 |
| Method And Device For The Contact-free Measurement Of Surface Contours App 20160202051 - Heist; Stefan ; et al. | 2016-07-14 |
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