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Patent applications and USPTO patent grants for Heinen; Bernd.The latest application filed is for "method for determining the path of a measurement beam of an interferometric measuring device, and measuring device for interferometric measurement of an object under measurement".
Patent | Date |
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Alignment method for a beam-directing unit of an interferometric measuring device, and measuring device for carrying out an interferometric measurement by means of laser radiation Grant 11,333,485 - Armbruster , et al. May 17, 2 | 2022-05-17 |
Alignment Method For A Beam-directing Unit Of An Interferometric Measuring Device, And Measuring Device For Carrying Out An Interferometric Measurement By Means Of Laser Radiation App 20210278197 - ARMBRUSTER; Bernd ;   et al. | 2021-09-09 |
Method For Determining The Path Of A Measurement Beam Of An Interferometric Measuring Device, And Measuring Device For Interferometric Measurement Of An Object Under Measurement App 20210278271 - ARMBRUSTER; Bernd ;   et al. | 2021-09-09 |
Method For Determining The Path Of A Measurement Beam Of An Interferometric Measuring Device, And Measuring Device For Interferometric Measurement Of An Object Under Measurement App 20210255030 - ARMBRUSTER; Bernd ;   et al. | 2021-08-19 |
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