Heeschen; William A.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Heeschen; William A..The latest application filed is for "polishing layer analyzer and method".
- Heeschen; William A. - Midland MI
| Patent | Date |
|---|---|
| Polishing layer analyzer and method Grant 10,272,541 - Chang , et al. | 2019-04-30 |
| Method of manufacturing chemical mechanical polishing pads Grant 9,770,808 - Acholla , et al. September 26, 2 | 2017-09-26 |
| Chemical mechanical polishing pad, polishing layer analyzer and method Grant 9,737,971 - Acholla , et al. August 22, 2 | 2017-08-22 |
| Polishing Layer Analyzer And Method App 20170209979 - Chang; Scott ; et al. | 2017-07-27 |
| Method Of Manufacturing Chemical Mechanical Polishing Pads App 20170197295 - Acholla; Francis V. ; et al. | 2017-07-13 |
| Chemical Mechanical Polishing Pad, Polishing Layer Analyzer And Method App 20170197290 - Acholla; Francis V. ; et al. | 2017-07-13 |
| Filter and membrane defect detection system Grant 8,875,562 - Wood , et al. November 4, 2 | 2014-11-04 |
| Positive skew styrene-acrylonitrile copolymer foam Grant 8,324,287 - Hood , et al. December 4, 2 | 2012-12-04 |
| Filter And Membrane Defect Detection System App 20120297863 - Wood; Stewart P. ; et al. | 2012-11-29 |
| Positive Skew Styrene-acrylonitrile Copolymer Foam App 20110028577 - Hood; Lawrence S. ; et al. | 2011-02-03 |
| Stable turbidity calibration standards Grant 7,843,560 - Harner , et al. November 30, 2 | 2010-11-30 |
| Digital Imaging System App 20100118130 - Harris; J. Keith ; et al. | 2010-05-13 |
| Stable Turbidity Calibration Standards App 20090059218 - Harner; Richard S. ; et al. | 2009-03-05 |
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