Hedengren; Kristina H. V.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hedengren; Kristina H. V..The latest application filed is for "eddy current array inspection device for shaped holes".

Company Profile

0.16.0

Hedengren; Kristina H. V. - Schenectady NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Eddy current array inspection device for shaped holes Grant 5,903,147 - Granger, Jr. , et al. May 11, 1	1999-05-11
Combining a priori data with partial scan data to project three dimensional imaging of arbitrary objects with computerized tomography Grant 5,611,026 - Eberhard , et al. March 11, 1	1997-03-11
Seam-tracking apparatus for a welding system employing an array of eddy current elements Grant 5,463,201 - Hedengren , et al. October 31, 1	1995-10-31
System and method for aligning an inspection probe and maintaining uniform spacing between the probe surface and an inspection surface Grant 5,418,457 - Hedengren , et al. May 23, 1	1995-05-23
Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part Grant 5,389,876 - Hedengren , et al. February 14, 1	1995-02-14
Apparatus and method for compensating for variations in the lift-off of eddy current surface inspection array elements Grant 5,371,461 - Hedengren December 6, 1	1994-12-06
Eddy current inspection method employing a probe array with test and reference data acquisition and signal processing Grant 5,371,462 - Hedengren , et al. December 6, 1	1994-12-06
Method for inspecting components having complex geometric shapes Grant 5,345,514 - Mahdavieh , et al. September 6, 1	1994-09-06
Three dimensional computerized tomography scanning configuration for imaging large objects with smaller area detectors Grant 5,319,693 - Eberhard , et al. June 7, 1	1994-06-07
Eddy current device for inspecting a component having a flexible support with a plural sensor array Grant 5,315,234 - Sutton, Jr. , et al. May 24, 1	1994-05-24
Complete 3D CT data acquisition using practical scanning paths on the surface of a sphere Grant 5,278,884 - Eberhard , et al. January 11, 1	1994-01-11
Apparatus for near surface nondestructive eddy current scanning of a conductive part using a multi-layer eddy current probe array Grant 5,262,722 - Hedengren , et al. November 16, 1	1993-11-16
Apparatus and method for non-destructive testing using multi-frequency eddy currents Grant 5,237,271 - Hedengren August 17, 1	1993-08-17
Square wave cone beam scanning trajectory for data completeness in three-dimensional computerized tomography Grant 5,073,910 - Eberhard , et al. December 17, 1	1991-12-17
Eddy current imaging apparatus and method using phase difference detection Grant 5,006,800 - Hedengren , et al. April 9, 1	1991-04-09
X-ray inspection system Grant 4,803,639 - Steele , et al. February 7, 1	1989-02-07

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.