Hedden; Richard N.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hedden; Richard N..The latest application filed is for "refresh circuitry".

Company Profile

1.11.10

Hedden; Richard N. - Kuna ID

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Refresh circuitry Grant 11,276,450 - Hedden March 15, 2	2022-03-15
Refresh Circuitry App 20190214071 - Hedden; Richard N.	2019-07-11
Refresh circuitry Grant 10,304,515 - Hedden	2019-05-28
Refresh Circuitry App 20170287544 - Hedden; Richard N.	2017-10-05
Refresh circuitry Grant 9,741,421 - Hedden August 22, 2	2017-08-22
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,294,790 - Van Horn , et al. November 13, 2	2007-11-13
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,239,152 - Van Horn , et al. July 3, 2	2007-07-03
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,212,013 - Van Horn , et al. May 1, 2	2007-05-01
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,208,935 - Van Horn , et al. April 24, 2	2007-04-24
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,208,959 - Van Horn , et al. April 24, 2	2007-04-24
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,199,593 - Van Horn , et al. April 3, 2	2007-04-03
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer Grant 7,145,323 - Van Horn , et al. December 5, 2	2006-12-05
Methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20060043987 - Van Horn; Mark T. ; et al.	2006-03-02
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20050161801 - Van Horn, Mark T. ; et al.	2005-07-28
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20050161256 - Horn, Mark T. Van ; et al.	2005-07-28
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20050024068 - Van Horn, Mark T. ; et al.	2005-02-03
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20040231887 - Van Horn, Mark T. ; et al.	2004-11-25
Apparatus for measuring parasitic capacitance and inductance of I/O leads on electrical component using a network analyzer Grant 6,822,438 - Van Horn , et al. November 23, 2	2004-11-23
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20030132768 - Van Horn, Mark T. ; et al.	2003-07-17
Apparatus for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20030128042 - Van Horn, Mark T. ; et al.	2003-07-10
Apparatus and methods for measuring parasitic capacitance and inductance of I/O leads on an electrical component using a network analyzer App 20030122565 - Van Horn, Mark T. ; et al.	2003-07-03

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