He; Jingrui

Patent Applications and Registrations

Patent applications and USPTO patent grants for He; Jingrui.The latest application filed is for "explaining outliers in time series and evaluating anomaly detection methods".

Company Profile

1.13.22

He; Jingrui - Champaign IL
He; Jingrui - Ossining NY US
He; Jingrui - Yorktown Heights NY
He; Jingrui - US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Explaining Outliers In Time Series And Evaluating Anomaly Detection Methods App 20220253426 - Zhu; Yada ; et al.	2022-08-11
Graph-based transfer learning Grant 9,477,929 - He , et al. October 25, 2	2016-10-25
System for wafer quality predictive modeling based on multi-source information with heterogeneous relatedness Grant 9,395,408 - Zhu , et al. July 19, 2	2016-07-19
Run-to-run control utilizing virtual metrology in semiconductor manufacturing Grant 9,299,623 - Baseman , et al. March 29, 2	2016-03-29
Run-to-run control utilizing virtual metrology in semiconductor manufacturing Grant 9,240,360 - Baseman , et al. January 19, 2	2016-01-19
Method and system for wafer quality predictive modeling based on multi-source information with heterogeneous relatedness Grant 9,176,183 - Zhu , et al. November 3, 2	2015-11-03
Finding a top-K diversified ranking list on graphs Grant 9,009,147 - He , et al. April 14, 2	2015-04-14
Graph-based framework for multi-task multi-view learning Grant 8,990,128 - He , et al. March 24, 2	2015-03-24
Method and apparatus for hierarchical wafer quality predictive modeling Grant 8,732,627 - Baseman , et al. May 20, 2	2014-05-20
Method and System for Wafer Quality Predictive Modeling based on Multi-Source Information with Heterogeneous Relatedness App 20140107824 - Zhu; Yada ; et al.	2014-04-17
Method and System for Wafer Quality Predictive Modeling based on Multi-Source Information with Heterogeneous Relatedness App 20140107828 - Zhu; Yada ; et al.	2014-04-17
Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Manufacturing App 20140031968 - Baseman; Robert Jeffrey ; et al.	2014-01-30
Run-to-Run Control Utilizing Virtual Metrology in Semiconductor Manufacturing App 20140031969 - Baseman; Robert J. ; et al.	2014-01-30
Method and Apparatus for Hierarchical Wafer Quality Predictive Modeling App 20130339919 - Baseman; Robert J. ; et al.	2013-12-19
Method and Apparatus for Hierarchical Wafer Quality Predictive Modeling App 20130338808 - Baseman; Robert J. ; et al.	2013-12-19
Graph-based Framework For Multi-task Multi-view Learning App 20130325756 - He; Jingrui ; et al.	2013-12-05
Measuring The Goodness Of A Top-k Diversified Ranking List App 20130046769 - He; Jingrui ; et al.	2013-02-21
Finding A Top-k Diversified Ranking List On Graphs App 20130046768 - He; Jingrui ; et al.	2013-02-21
System And Method For Automated Labeling Of Text Documents Using Ontologies App 20130018828 - He; Jingrui ; et al.	2013-01-17
System And Method For Automated Labeling Of Text Documents Using Ontologies App 20130018827 - He; Jingrui ; et al.	2013-01-17
Graph-based Transfer Learning App 20130013540 - He; Jingrui ; et al.	2013-01-10
Graph-based transfer learning App 20110320387 - He; Jingrui ; et al.	2011-12-29

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.