Hayler; Wendie Patricia
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hayler; Wendie Patricia.The latest application filed is for "x-ray scanning system and method".
- Hayler; Wendie Patricia - Atlanta GA
| Patent | Date |
|---|---|
| X-ray Scanning System And Method App 20200186353 - Hayler; Wendie Patricia ; et al. | 2020-06-11 |
| X-ray scanning system and method Grant 10,571,597 - Hayler , et al. Feb | 2020-02-25 |
| X-ray Scanning System And Method App 20190146116 - Hayler; Wendie Patricia ; et al. | 2019-05-16 |
| X-ray scanning system and method Grant 10,203,426 - Hayler , et al. Feb | 2019-02-12 |
| X-ray Scanning System And Method App 20180306943 - Hayler; Wendie Patricia ; et al. | 2018-10-25 |
| X-ray scanning system and method Grant 10,012,755 - Hayler , et al. July 3, 2 | 2018-07-03 |
| X-ray Scanning System And Method App 20180024267 - Hayler; Wendie Patricia ; et al. | 2018-01-25 |
| X-ray scanning system and method Grant 9,804,289 - Hayler , et al. October 31, 2 | 2017-10-31 |
| X-ray Scanning System And Method App 20170075025 - Hayler; Wendie Patricia ; et al. | 2017-03-16 |
| X-ray scanning system and method Grant 9,541,667 - Hayler , et al. January 10, 2 | 2017-01-10 |
| X-ray Scanning System And Method App 20160356914 - Hayler; Wendie Patricia ; et al. | 2016-12-08 |
| X-ray Scanning System And Method App 20150063539 - HAYLER; WENDIE PATRICIA ; et al. | 2015-03-05 |
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