Hayes; Timothy S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hayes; Timothy S..The latest application filed is for "system and method for forming an aluminum fuse for compatibility with copper beol interconnect scheme".

Company Profile

2.7.8

Hayes; Timothy S. - Colchester VT
- Colchester VT US
Hayes; Timothy S. - Milton VT
Hayes, Timothy S - Milton VT
Hayes; Timothy S. - Hinesburg VT
Hayes; Timothy S. - Hingesburg VT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for forming an aluminum fuse for compatibility with copper BEOL interconnect scheme Grant 8,927,411 - Anderson , et al. January 6, 2	2015-01-06
System and method for forming aluminum fuse for compatibility with copper BEOL interconnect scheme Grant 08921975 -	2014-12-30
System and method for forming aluminum fuse for compatibility with copper BEOL interconnect scheme Grant 8,921,975 - Anderson , et al. December 30, 2	2014-12-30
System And Method For Forming An Aluminum Fuse For Compatibility With Copper Beol Interconnect Scheme App 20140106559 - Anderson; Felix P. ; et al.	2014-04-17
System And Method For Forming Aluminum Fuse For Compatibility With Copper Beol Interconnect Scheme App 20130320488 - Anderson; Felix P. ; et al.	2013-12-05
Method And Apparatus For Singulating Integrated Circuit Chips App 20090155981 - Ayotte; Stephen P. ; et al.	2009-06-18
Method and system for quantifying the step profile characteristics semiconductor features using surface analysis data Grant 6,980,937 - Hayes December 27, 2	2005-12-27
Methodology for measuring and controlling film thickness profiles Grant 6,864,189 - Hayes , et al. March 8, 2	2005-03-08
Methodology For Measuring And Controlling Film Thickness Profiles App 20040266035 - Hayes, Timothy S ; et al.	2004-12-30
Incorporation of an impurity into a thin film Grant 6,774,019 - Choate, IV , et al. August 10, 2	2004-08-10
Incorporation of an impurity into a thin film App 20040144313 - Choate, Charles Augustus IV ; et al.	2004-07-29
Method and system for measuring characteristics of curved features Grant 6,724,947 - Hayes April 20, 2	2004-04-20
Incorporation of an impurity into a thin film App 20030213433 - Choate, Charles Augustus IV ; et al.	2003-11-20
Method and system for quantifying the step profile characteristics semiconductor features usingsurface analysis data App 20030108235 - Hayes, Timothy S.	2003-06-12

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.