Hayes; Jerry D.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hayes; Jerry D..The latest application filed is for "test circuit for bias temperature instability recovery measurements".

Company Profile

1.34.33

Hayes; Jerry D. - Georgetown TX
Hayes; Jerry D. - Austin TX
Hayes; Jerry D. - Milton VT
Hayes; Jerry D. - Georgetwon TX
Hayes; Jerry D - Mllton VT
Hayes; Jerry D. - Mllton VT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and test system for fast determination of parameter variation statistics Grant 8,862,426 - Agarwal , et al. October 14, 2	2014-10-14
Test circuit for bias temperature instability recovery measurements Grant 8,676,516 - Gebara , et al. March 18, 2	2014-03-18
Characterization of long range variability Grant 8,336,008 - Culp , et al. December 18, 2	2012-12-18
Test Circuit For Bias Temperature Instability Recovery Measurements App 20120262187 - Gebara; Fadi H. ; et al.	2012-10-18
Test circuit for bias temperature instability recovery measurements Grant 8,229,683 - Gebara , et al. July 24, 2	2012-07-24
Parallel array architecture for constant current electro-migration stress testing Grant 8,217,671 - Agarwal , et al. July 10, 2	2012-07-10
Configurable PSRO structure for measuring frequency dependent capacitive loads Grant 8,154,309 - Agarwal , et al. April 10, 2	2012-04-10
Measurement methodology and array structure for statistical stress and test of reliabilty structures Grant 8,120,356 - Agarwal , et al. February 21, 2	2012-02-21
On-chip measurement of signals Grant 8,089,296 - Agarwal , et al. January 3, 2	2012-01-03
Method and system for evaluating timing in an integrated circuit Grant 7,962,874 - Foreman , et al. June 14, 2	2011-06-14
Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery Grant 7,949,482 - Gebara , et al. May 24, 2	2011-05-24
Characterization of Long Range Variability App 20110078641 - Culp; James A. ; et al.	2011-03-31
Test Circuit For Bias Temperature Instability Recovery Measurements App 20110074394 - Gebara; Fadi H. ; et al.	2011-03-31
Slack sensitivity to parameter variation based timing analysis Grant 7,870,525 - Foreman , et al. January 11, 2	2011-01-11
Array-based early threshold voltage recovery characterization measurement Grant 7,868,640 - Agarwal , et al. January 11, 2	2011-01-11
Method of generating wiring routes with matching delay in the presence of process variation Grant 7,865,861 - Habitz , et al. January 4, 2	2011-01-04
Parallel Array Architecture for Constant Current Electro-Migration Stress Testing App 20100327892 - Agarwal; Kanak B. ; et al.	2010-12-30
Configurable Psro Structure For Measuring Frequency Dependent Capacitive Loads App 20100321042 - Agarwal; Kanak B. ; et al.	2010-12-23
On-chip Measurement Of Signals App 20100321050 - Agarwal; Kanak Behari ; et al.	2010-12-23
Measurement Methodology And Array Structure For Statistical Stress And Test Of Reliabilty Structures App 20100318313 - Agarwal; Kanak B. ; et al.	2010-12-16
Method and apparatus for statistical CMOS device characterization Grant 7,834,649 - Agarwal , et al. November 16, 2	2010-11-16
Method of generating wiring routes with matching delay in the presence of process variation Grant 7,823,115 - Habitz , et al. October 26, 2	2010-10-26
Characterization circuit for fast determination of device capacitance variation Grant 7,818,137 - Agarwal , et al. October 19, 2	2010-10-19
Method And Apparatus For Statistical Cmos Device Characterization App 20100225348 - Agarwal; Kanak B. ; et al.	2010-09-09
Method and apparatus for statistical CMOS device characterization Grant 7,782,076 - Agarwal , et al. August 24, 2	2010-08-24
Method and apparatus for measuring statistics of dram parameters with minimum perturbation to cell layout and environment Grant 7,768,814 - Argawal , et al. August 3, 2	2010-08-03
Slack sensitivity to parameter variation based timing analysis Grant 7,716,616 - Foreman , et al. May 11, 2	2010-05-11
Method and Apparatus for Measuring Statistics of Dram Parameters with Minimum Perturbation to Cell Layout and Environment App 20100074040 - Agarwal; Kanak B. ; et al.	2010-03-25
System and method of analyzing timing effects of spatial distribution in circuits Grant 7,680,626 - Hathaway , et al. March 16, 2	2010-03-16
Delay-Based Bias Temperature Instability Recovery Measurements for Characterizing Stress Degradation and Recovery App 20090319202 - Gebara; Fadi H. ; et al.	2009-12-24
Array-Based Early Threshold Voltage Recovery Characterization Measurement App 20090251167 - Agarwal; Kanak B. ; et al.	2009-10-08
Characterization Circuit For Fast Determination Of Device Capacitance Variation App 20090160463 - Agarwal; Kanak B. ; et al.	2009-06-25
Method And Test System For Fast Determination Of Parameter Variation Statistics App 20090160477 - Agarwal; Kanak B. ; et al.	2009-06-25
Method And System For Isolating Dopant Fluctuation And Device Length Variation From Statistical Measurements Of Threshold Voltage App 20090164155 - AGARWAL; KANAK B. ; et al.	2009-06-25
Method And System For Evaluating Timing In An Integrated Circuit App 20080313590 - FOREMAN; Eric A. ; et al.	2008-12-18
Method And Apparatus For Statistical Cmos Device Characterization App 20080284460 - Agarwal; Kanak B. ; et al.	2008-11-20
Method and system for evaluating timing in an integrated circuit Grant 7,444,608 - Foreman , et al. October 28, 2	2008-10-28
Slack Sensitivity To Parameter Variation Based Timing Analysis App 20080216036 - Foreman; Eric A. ; et al.	2008-09-04
Method of generating wiring routes with matching delay in the presence of process variation Grant 7,418,689 - Habitz , et al. August 26, 2	2008-08-26
Method of Generating Wiring Routes with Matching Delay in the Presence of Process Variation App 20080201683 - Habitz; Peter A. ; et al.	2008-08-21
Method of Generating Wiring Routes with Matching Delay in the Presence of Process Variation App 20080195993 - Habitz; Peter A. ; et al.	2008-08-14
Slack sensitivity to parameter variation based timing analysis Grant 7,401,307 - Foreman , et al. July 15, 2	2008-07-15
Method and apparatus for statistical CMOS device characterization Grant 7,397,259 - Agarwal , et al. July 8, 2	2008-07-08
Analysis Techniques To Reduce Simulations To Characterize The Effect Of Variations In Transistor Circuits App 20080126061 - Hayes; Jerry D. ; et al.	2008-05-29
Slack Sensitivity To Parameter Variation Based Timing Analysis App 20080052656 - Foreman; Eric A. ; et al.	2008-02-28
Method and system for performing shapes correction of a multi-cell reticle photomask design Grant 7,302,673 - Habitz , et al. November 27, 2	2007-11-27
System and method of analyzing timing effects of spatial distribution in circuits Grant 7,280,939 - Hathaway , et al. October 9, 2	2007-10-09
System And Method Of Analyzing Timing Effects Of Spatial Distribution In Circuits App 20070220345 - HATHAWAY; David J. ; et al.	2007-09-20
Ring oscillator structure and method of separating random and systematic tolerance values Grant 7,266,474 - Habitz , et al. September 4, 2	2007-09-04
Method and apparatus for performing input/output floor planning on an integrated circuit design Grant 7,231,335 - Hayes , et al. June 12, 2	2007-06-12
Variable Sigma Adjust Methodology For Static Timing App 20070089078 - Engel; James J. ; et al.	2007-04-19
Method For Reticle Shapes Analysis And Correction App 20070061771 - Habitz; Peter Anton ; et al.	2007-03-15
Ring Oscillator Structure And Method Of Separating Random And Systematic Tolerance Values App 20070050164 - Habitz; Peter A. ; et al.	2007-03-01
Variable sigma adjust methodology for static timing Grant 7,174,523 - Engel , et al. February 6, 2	2007-02-06
Method Of Generating Wiring Routes With Matching Delay In The Presence Of Process Variation App 20060248488 - Habitz; Peter A. ; et al.	2006-11-02
Method And System For Evaluating Timing In An Integated Circuit App 20060195807 - Foreman; Eric A. ; et al.	2006-08-31
Method and system for evaluating timing in an integrated circuit Grant 7,089,143 - Foreman , et al. August 8, 2	2006-08-08
Slack Sensitivity To Parameter Variation Based Timing Analysis App 20060101361 - Foreman; Eric A. ; et al.	2006-05-11
Variable Sigma Adjust Methodology For Static Timing App 20060026544 - Engel; James J. ; et al.	2006-02-02
Circuit and method for modeling I/O Grant 6,983,432 - Hayes January 3, 2	2006-01-03
System And Method Of Analyzing Timing Effects Of Spatial Distribution In Circuits App 20050246117 - Hathaway, David J. ; et al.	2005-11-03
Method And System For Evaluating Timing In An Integrated Circuit App 20050246116 - Foreman, Eric A. ; et al.	2005-11-03
Method And Apparatus For Performing Input/output Floor Planning On An Integrated Circuit Design App 20040267511 - Hayes, Jerry D. ; et al.	2004-12-30
Circuit and method for modeling I/O App 20020188915 - Hayes, Jerry D.	2002-12-12
System and method for AC performance tuning by thereshold voltage shifting in tubbed semiconductor technology Grant 6,487,701 - Dean , et al. November 26, 2	2002-11-26

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