Hayden; Leonard
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hayden; Leonard.The latest application filed is for "bipolar transistor".
Company Profile
0.23.26
- Hayden; Leonard - Portland OR
- Hayden; Leonard - Beaverton OR
Patent Activity
| Patent | Date |
|---|---|
| Bipolar transistor Grant 11,282,923 - Zampardi , et al. March 22, 2 | 2022-03-22 |
| Bipolar Transistor App 20210175328 - Zampardi; Peter J. ; et al. | 2021-06-10 |
| Line-reflect-reflect Match Calibration App 20110178752 - Hayden; Leonard | 2011-07-21 |
| Line-reflect-reflect match calibration Grant 7,908,107 - Hayden March 15, 2 | 2011-03-15 |
| Wafer Probe App 20100251545 - Hayden; Leonard ; et al. | 2010-10-07 |
| Method of assembling a wafer probe Grant 7,761,983 - Hayden , et al. July 27, 2 | 2010-07-27 |
| Wafer probe Grant 7,688,097 - Hayden , et al. March 30, 2 | 2010-03-30 |
| Shielded probe for testing a device under test Grant 7,518,387 - Gleason , et al. April 14, 2 | 2009-04-14 |
| Wafer probe Grant 7,495,461 - Hayden , et al. February 24, 2 | 2009-02-24 |
| Shielded probe for testing a device under test Grant 7,489,149 - Gleason , et al. February 10, 2 | 2009-02-10 |
| Shielded probe for testing a device under test Grant 7,482,823 - Gleason , et al. January 27, 2 | 2009-01-27 |
| Wafer probe Grant 7,456,646 - Hayden , et al. November 25, 2 | 2008-11-25 |
| Probe for combined signals Grant 7,453,276 - Hayden , et al. November 18, 2 | 2008-11-18 |
| Shielded probe with low contact resistance for testing a device under test Grant 7,436,194 - Gleason , et al. October 14, 2 | 2008-10-14 |
| Probe for combined signals Grant 7,417,446 - Hayden , et al. August 26, 2 | 2008-08-26 |
| Waveguide adapter for probe assembly having a detachable bias tee Grant 7,352,258 - Andrews , et al. April 1, 2 | 2008-04-01 |
| Probe for combined signals App 20080074129 - Hayden; Leonard ; et al. | 2008-03-27 |
| Probe for testing a device under test App 20080054929 - Gleason; K. Reed ; et al. | 2008-03-06 |
| Probe for testing a device under test App 20080054923 - Gleason; K. Reed ; et al. | 2008-03-06 |
| Probe for testing a device under test App 20080048692 - Gleason; K. Reed ; et al. | 2008-02-28 |
| Wafer probe App 20080042677 - Hayden; Leonard ; et al. | 2008-02-21 |
| Wafer probe App 20080042678 - Hayden; Leonard ; et al. | 2008-02-21 |
| Wafer probe App 20080045028 - Hayden; Leonard ; et al. | 2008-02-21 |
| Probe for combined signals App 20080042673 - Hayden; Leonard ; et al. | 2008-02-21 |
| Probe for testing a device under test App 20080024149 - Gleason; K. Reed ; et al. | 2008-01-31 |
| Line-reflect-reflect match calibration App 20080018343 - Hayden; Leonard | 2008-01-24 |
| Calibration system App 20070294047 - Hayden; Leonard | 2007-12-20 |
| Shielded probe for high-frequency testing of a device under test Grant 7,304,488 - Gleason , et al. December 4, 2 | 2007-12-04 |
| Probe for combined signals Grant 7,285,969 - Hayden , et al. October 23, 2 | 2007-10-23 |
| Wafer probe App 20070200580 - Hayden; Leonard ; et al. | 2007-08-30 |
| Probe for combined signals App 20070159196 - Hayden; Leonard ; et al. | 2007-07-12 |
| Wafer probe Grant 7,233,160 - Hayden , et al. June 19, 2 | 2007-06-19 |
| Probe for combined signals Grant 7,205,784 - Hayden , et al. April 17, 2 | 2007-04-17 |
| Probe for testing a device under test App 20070075716 - Gleason; K. Reed ; et al. | 2007-04-05 |
| Probe for testing a device under test Grant 7,161,363 - Gleason , et al. January 9, 2 | 2007-01-09 |
| Probe for combined signals App 20060214677 - Hayden; Leonard ; et al. | 2006-09-28 |
| Probe for combined signals Grant 7,075,320 - Hayden , et al. July 11, 2 | 2006-07-11 |
| Probe for combined signals Grant 7,046,023 - Hayden , et al. May 16, 2 | 2006-05-16 |
| Probe for combined signals App 20050151548 - Hayden, Leonard ; et al. | 2005-07-14 |
| Probe for combined signals App 20050024069 - Hayden, Leonard ; et al. | 2005-02-03 |
| Probe for testing a device under test App 20040232927 - Gleason, K. Reed ; et al. | 2004-11-25 |
| Probe for testing a device under test Grant 6,815,963 - Gleason , et al. November 9, 2 | 2004-11-09 |
| Probe for combined signals Grant 6,806,724 - Hayden , et al. October 19, 2 | 2004-10-19 |
| Probe for combined signals App 20040095156 - Hayden, Leonard ; et al. | 2004-05-20 |
| Probe For Combined Signals App 20040090238 - Hayden, Leonard ; et al. | 2004-05-13 |
| Probe for combined signals Grant 6,724,205 - Hayden , et al. April 20, 2 | 2004-04-20 |
| Probe for testing a device under test App 20040004491 - Gleason, K. Reed ; et al. | 2004-01-08 |
| Waveguide adapter App 20030184404 - Andrews, Mike ; et al. | 2003-10-02 |
| Wafer probe App 20020075019 - Hayden, Leonard ; et al. | 2002-06-20 |
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