loadpatents
name:-0.035535097122192
name:-0.028163909912109
name:-0.0041117668151855
HAYASHI; Kazushi Patent Filings

HAYASHI; Kazushi

Patent Applications and Registrations

Patent applications and USPTO patent grants for HAYASHI; Kazushi.The latest application filed is for "cyclic azine compound, material for organic light emitting diode, electron transport material for organic light emitting diode, and organic light emitting diode".

Company Profile
3.23.28
  • HAYASHI; Kazushi - Ayase-Shi JP
  • Hayashi; Kazushi - Hyogo JP
  • Hayashi; Kazushi - Kobe JP
  • HAYASHI; Kazushi - Kobe-shi JP
  • Hayashi; Kazushi - Osaka JP
  • Hayashi; Kazushi - Aichi-gun JP
  • Hayashi; Kazushi - Sagamihara-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Cyclic Azine Compound, Material For Organic Light Emitting Diode, Electron Transport Material For Organic Light Emitting Diode, And Organic Light Emitting Diode
App 20220274952 - UCHIDA; Naoki ;   et al.
2022-09-01
Method for evaluating quality of oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and device for manufacturing semiconductor using said method for managing quality
Grant 10,475,711 - Hayashi , et al. Nov
2019-11-12
Method For Evaluating Quality Of Oxide Semiconductor Thin Film, Method For Managing Quality Of Oxide Semiconductor Thin Film, And Device For Manufacturing Semiconductor Using Said Method For Managing Quality
App 20190122941 - HAYASHI; Kazushi ;   et al.
2019-04-25
Quality evaluation method for laminate having protective layer on surface of oxide semiconductor thin film and quality control method for oxide semiconductor thin film
Grant 10,203,367 - Hayashi , et al. Feb
2019-02-12
Evaluation method for oxide semiconductor thin film, quality control method for oxide semiconductor thin film, and evaluation element and evaluation device used in the evaluation method
Grant 10,090,208 - Kishi , et al. October 2, 2
2018-10-02
Negative Electrode For Iron-air Secondary Battery, Iron-air Secondary Battery, And Production Method Of Negative Electrode For Iron-air Secondary Battery
App 20180219220 - HAYASHI; Kazushi ;   et al.
2018-08-02
Method for evaluating oxide semiconductor thin film, method for managing quality of oxide semiconductor thin film, and evaluation element and evaluation device used in above evaluation method
Grant 9,816,944 - Hayashi , et al. November 14, 2
2017-11-14
Method for evaluating quality of oxide semiconductor thin film and laminated body having protective film on surface of oxide semiconductor thin film, and method for managing quality of oxide semiconductor thin film
Grant 9,780,005 - Kawakami , et al. October 3, 2
2017-10-03
Quality Evaluation Method For Laminate Having Protective Layer On Surface Of Oxide Semiconductor Thin Film And Quality Control Method For Oxide Semiconductor Thin Film
App 20170184660 - HAYASHI; Kazushi ;   et al.
2017-06-29
Oxide for semiconductor layer of thin film transistor, thin film transistor and display device
Grant 9,583,633 - Ahn , et al. February 28, 2
2017-02-28
Method For Evaluating Oxide Semiconductor Thin Film, Method For Managing Quality Of Oxide Semiconductor Thin Film, And Evaluation Element And Evaluation Device Used In Above Evaluation Method
App 20160282284 - HAYASHI; Kazushi ;   et al.
2016-09-29
Evaluation Device For Oxide Semiconductor Thin Film
App 20160223462 - HAYASHI; Kazushi ;   et al.
2016-08-04
Oxide For Semiconductor Layer Of Thin Film Transistor, Thin Film Transistor And Display Device
App 20160211384 - AHN; BYUNG DU ;   et al.
2016-07-21
Method for evaluating oxide semiconductor thin film, and method for quality control of oxide semiconductor thin film
Grant 9,316,589 - Hayashi , et al. April 19, 2
2016-04-19
Apparatus and method for measuring semiconductor carrier lifetime
Grant 9,279,762 - Hayashi , et al. March 8, 2
2016-03-08
Evaluation Method For Oxide Semiconductor Thin Film, Quality Control Method For Oxide Semiconductor Thin Film, And Evaluation Element And Evaluation Device Used In The Evaluation Method
App 20150371906 - KISHI; Tomoya ;   et al.
2015-12-24
Oxide For Semiconductor Layer Of Thin Film Transistor, Thin Film Transistor, And Display Device
App 20150364553 - KOSAKA; Shuji ;   et al.
2015-12-17
Method For Evaluating Oxide Semiconductor Thin Film, And Method For Quality Control Of Oxide Semiconductor Thin Film
App 20150355095 - HAYASHI; Kazushi ;   et al.
2015-12-10
Oxide For Semiconductor Layer Of Thin Film Transistor, Thin Film Transistor, And Display Device
App 20150357474 - KOSAKA; Shuji ;   et al.
2015-12-10
Apparatus And Method For Measuring Semiconductor Carrier Lifetime
App 20120203473 - Hayashi; Kazushi ;   et al.
2012-08-09
Multiple Power-supply Simulation Result Analyzer And Method Of Analyzing The Same
App 20120046931 - Takahashi; Hiroshi ;   et al.
2012-02-23
Method and apparatus for forming thin film
Grant 7,897,025 - Inoue , et al. March 1, 2
2011-03-01
Beam Detector and Beam Monitor Using The Same
App 20100219350 - Kobashi; Koji ;   et al.
2010-09-02
Heating unit and resin sheet heating apparatus
Grant 7,539,401 - Takai , et al. May 26, 2
2009-05-26
Method For Forming Thin Film
App 20090098311 - AOMINE; Nobutaka ;   et al.
2009-04-16
Heating apparatus and heating method
Grant 7,495,194 - Takai , et al. February 24, 2
2009-02-24
Surface-treatment method and equipment
Grant 7,459,187 - Hayashi , et al. December 2, 2
2008-12-02
Heating Unit And Resin Sheet Heating Apparatus
App 20080124061 - Takai; Toshihiro ;   et al.
2008-05-29
Radiant Heater
App 20080083733 - Takai; Toshihiro ;   et al.
2008-04-10
Heating Apparatus And Heating Method
App 20080083735 - Takai; Toshihiro ;   et al.
2008-04-10
Heating system
Grant 7,323,664 - Takai , et al. January 29, 2
2008-01-29
Highly-oriented diamond film, method for manufacturing the same, and electronic device having highly-oriented diamond film
Grant 7,311,977 - Yokota , et al. December 25, 2
2007-12-25
Semiconductor device and method for manufacturing multilayered substrate for semiconductor device
Grant 7,285,479 - Tachibana , et al. October 23, 2
2007-10-23
Surface-treatment method and equipment
App 20070134414 - Hayashi; Kazushi ;   et al.
2007-06-14
Ultraviolet sensor and method for manufacturing the same
Grant 7,193,241 - Hayashi , et al. March 20, 2
2007-03-20
Copper base for electronic component, electronic component, and process for producing copper base for electronic component
App 20070039666 - Hayashi; Kazushi ;   et al.
2007-02-22
Semiconductor device and method for manufacturing multilayered substrate for semiconductor device
App 20060175293 - Tachibana; Takeshi ;   et al.
2006-08-10
Direct memory access system
App 20060161695 - Mochizuki; Shuji ;   et al.
2006-07-20
Heat spreader and semiconductor device and package using the same
Grant 7,067,903 - Tachibana , et al. June 27, 2
2006-06-27
Diamond semiconductor device and method for manufacturing the same
Grant 7,064,352 - Yokota , et al. June 20, 2
2006-06-20
Highly-oriented diamond film, method for manufacturing the same, and electronic device having highly-oriented diamond film
App 20060112874 - Yokota; Yoshihiro ;   et al.
2006-06-01
Diamond sensor
App 20060001029 - Hayashi; Kazushi ;   et al.
2006-01-05
Ultraviolet sensor and method for manufacturing the same
App 20050181122 - Hayashi, Kazushi ;   et al.
2005-08-18
Method and apparatus for forming thin film
App 20050136694 - Inoue, Kenichi ;   et al.
2005-06-23
Diamond semiconductor device and method for manufacturing the same
App 20050127373 - Yokota, Yoshihiro ;   et al.
2005-06-16
Heat spreader and semiconductor device and package using the same
App 20040238946 - Tachibana, Takeshi ;   et al.
2004-12-02
Method of forming diamond film
Grant 6,383,288 - Hayashi , et al. May 7, 2
2002-05-07
Highly-oriented diamond film heat dissipating substrate
Grant 5,529,846 - Hayashi , et al. June 25, 1
1996-06-25
Formation of highly oriented diamond film
Grant 5,479,875 - Tachibana , et al. January 2, 1
1996-01-02
Heat-resisting ohmic contact on semiconductor diamond layer
Grant 5,436,505 - Hayashi , et al. July 25, 1
1995-07-25

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