| Patent | Date |
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Thread
App 20220235496 - INOUE; Takafumi ; et al. | 2022-07-28 |
Cylindrical Structure
App 20220228300 - INOUE; Takafumi ; et al. | 2022-07-21 |
Deep-body-temperature estimation system, heat stress warning system, and deep-body-temperature estimation method
Grant 11,291,373 - Kimura , et al. April 5, 2 | 2022-04-05 |
Deep-body-temperature Estimation System, Heat Stress Warning System, And Deep-body-temperature Estimation Method
App 20200367758 - KIMURA; Tasuku ; et al. | 2020-11-26 |
Currency Exchange System And Remittance System
App 20200327612 - HAYASHI; Hirokazu | 2020-10-15 |
Article Provided With Warning System
App 20190122517 - KIMURA; Tasuku ; et al. | 2019-04-25 |
Removal device for semiconductor manufacturing apparatus and semiconductor manufacturing apparatus
Grant 9,957,611 - Hayashi May 1, 2 | 2018-05-01 |
Cationic electrodeposition coating composition and coated article
Grant 9,617,650 - Okada , et al. April 11, 2 | 2017-04-11 |
Removal Device For Semiconductor Manufacturing Apparatus And Semiconductor Manufacturing Apparatus
App 20170067152 - Hayashi; Hirokazu | 2017-03-09 |
Seal member for fuel cell and fuel cell seal body using same
Grant 9,543,596 - Yamamoto , et al. January 10, 2 | 2017-01-10 |
Seal Member For Fuel Cell And Fuel Cell Seal Body Using Same
App 20150288004 - Yamamoto; Kenji ; et al. | 2015-10-08 |
Rubber Composition And Fuel Cell Sealed Body
App 20140287340 - Yamamoto; Kenji ; et al. | 2014-09-25 |
Cationic Electrodeposition Coating Composition And Coated Article
App 20140042031 - Okada; Eisaku ; et al. | 2014-02-13 |
Semiconductor Device And Method For Manufacturing The Same
App 20130221498 - HAYASHI; Hirokazu | 2013-08-29 |
Method for forming coating film
Grant 8,414,753 - Okada , et al. April 9, 2 | 2013-04-09 |
ESD protection device and manufacturing method thereof
Grant 8,159,033 - Hayashi April 17, 2 | 2012-04-17 |
Method For Forming Coating Film
App 20110068009 - Okada; Eisaku ; et al. | 2011-03-24 |
Semiconductor device using SOI-substrate
Grant 7,859,063 - Hayashi December 28, 2 | 2010-12-28 |
Semiconductor integrated circuit
Grant 7,729,096 - Hayashi June 1, 2 | 2010-06-01 |
Load driving device
Grant 7,723,794 - Kuroda , et al. May 25, 2 | 2010-05-25 |
Electro-static discharge protection circuit and semiconductor device having the same
Grant 7,671,415 - Kuroda , et al. March 2, 2 | 2010-03-02 |
ESD protection device and manufacturing method thereof
App 20090242993 - Hayashi; Hirokazu | 2009-10-01 |
Semiconductor Device Using Soi-substrate
App 20090152630 - HAYASHI; Hirokazu | 2009-06-18 |
Semiconductor device having electrostatic discharge element
Grant 7,521,713 - Hayashi April 21, 2 | 2009-04-21 |
Electro-static discharge protection circuit and semiconductor device having the same
Grant 7,498,615 - Kuroda , et al. March 3, 2 | 2009-03-03 |
Evaluation TEG for semiconductor device and method of evaluation
Grant RE40,597 - Hayashi December 2, 2 | 2008-12-02 |
Design and simulation methods for electrostatic protection circuits
Grant 7,434,179 - Hayashi October 7, 2 | 2008-10-07 |
Semiconductor integrated circuit
App 20080225450 - Hayashi; Hirokazu | 2008-09-18 |
Breeding Support System
App 20080147458 - Yamazaki; Akihiro ; et al. | 2008-06-19 |
Polyester Pile Fabric Having Excellent Soft Hand, Abrasion Resistance And Bathochromic Effect
App 20080020173 - Fukunaga; Migifumi ; et al. | 2008-01-24 |
Electrostatic discharge protection device modeling method and electrostatic discharge simulation method
Grant 7,302,378 - Hayashi November 27, 2 | 2007-11-27 |
Pile Fabric And Method For Producing The Same
App 20070215231 - Hayashi; Hirokazu ; et al. | 2007-09-20 |
Method of evaluating semiconductor device
Grant 7,268,003 - Hayashi September 11, 2 | 2007-09-11 |
Pile fabric and method for producing the same
App 20070122585 - Fukuro; Tadayuki ; et al. | 2007-05-31 |
Method for modeling semiconductor device process
Grant 7,197,439 - Hayashi March 27, 2 | 2007-03-27 |
Load driving device
App 20070052033 - Kuroda; Toshikazu ; et al. | 2007-03-08 |
Electro-static Discharge Protection Circuit And Semiconductor Device Having The Same
App 20060220137 - KURODA; Toshikazu ; et al. | 2006-10-05 |
Design and simulation methods for electrostatic protection circuits
App 20060194382 - Hayashi; Hirokazu | 2006-08-31 |
Semiconductor device and method of producing the same
App 20060054892 - Hayashi; Hirokazu | 2006-03-16 |
Evaluation TEG for semiconductor device and method of evaluation
Grant 7,000,201 - Hayashi February 14, 2 | 2006-02-14 |
Method for modeling semiconductor device and network
Grant 6,981,236 - Hayashi December 27, 2 | 2005-12-27 |
Semiconductor device and method of manufacturing the same
App 20050275030 - Hayashi, Hirokazu | 2005-12-15 |
Method of evaluating semiconductor device
App 20050196884 - Hayashi, Hirokazu | 2005-09-08 |
ESD protection device modeling method and ESD simulation method
App 20050065762 - Hayashi, Hirokazu | 2005-03-24 |
Method for modeling semiconductor device and network
App 20040210858 - Hayashi, Hirokazu | 2004-10-21 |
Evaluation TEG for semiconductor device and method of evaluation
App 20040163071 - Hayashi, Hirokazu | 2004-08-19 |
Method for modeling semiconductor device process
App 20020183991 - Hayashi, Hirokazu | 2002-12-05 |
SOI structure semiconductor device and a fabrication method thereof
App 20010036710 - Hayashi, Hirokazu ; et al. | 2001-11-01 |
Method for modeling diffusion of impurities in a semiconductor
App 20010025367 - Hayashi, Hirokazu | 2001-09-27 |
Method of fabricating a SOI structure semiconductor device
Grant 6,277,684 - Hayashi , et al. August 21, 2 | 2001-08-21 |
Projected image displaying apparatus and a method of correcting color unevenness therein
Grant 5,452,019 - Fukuda , et al. September 19, 1 | 1995-09-19 |
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