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Patent applications and USPTO patent grants for Hayakawa; Shigeyuki.The latest application filed is for "semiconductor device".
Patent | Date |
---|---|
Semiconductor device Grant 8,558,390 - Wakita , et al. October 15, 2 | 2013-10-15 |
Semiconductor Device App 20130140687 - WAKITA; Naoki ;   et al. | 2013-06-06 |
Fuse-data reading circuit Grant 7,495,310 - Douzaka , et al. February 24, 2 | 2009-02-24 |
Anti-fuse memory circuit Grant 7,349,281 - Kouchi , et al. March 25, 2 | 2008-03-25 |
Anti-fuse memory circuit App 20070058473 - Kouchi; Toshiyuki ;   et al. | 2007-03-15 |
Fuse-data reading circuit App 20050280495 - Douzaka, Toshiaki ;   et al. | 2005-12-22 |
Semiconductor integrated circuit device Grant 6,977,834 - Onizawa , et al. December 20, 2 | 2005-12-20 |
Semiconductor integrated circuit device App 20050111267 - Onizawa, Tadashi ;   et al. | 2005-05-26 |
Cam Cell Circuit Having Decision Circuit App 20020039303 - Hayakawa, Shigeyuki ;   et al. | 2002-04-04 |
Semiconductor integrated circuit having logical operation function App 20020003438 - Hayakawa, Shigeyuki | 2002-01-10 |
Logic circuits and carry-lookahead circuits App 20010037349 - Hayakawa, Shigeyuki | 2001-11-01 |
Logic circuits and carry-lookahead circuits App 20010032223 - Hayakawa, Shigeyuki | 2001-10-18 |
Impedance matching circuit, high speed semiconductor integrated circuit employing the same and computer system employing the integrated circuit Grant 6,188,237 - Suzuki , et al. February 13, 2 | 2001-02-13 |
Latch-type sense amplifier for amplifying low level differential input signals Grant 6,184,722 - Hayakawa February 6, 2 | 2001-02-06 |
Liquid crystal display device Grant 5,712,652 - Sato , et al. January 27, 1 | 1998-01-27 |
Semiconductor memory device having a plurality of blocks Grant 5,479,373 - Takeuchi , et al. December 26, 1 | 1995-12-26 |
Semiconductor memory device having redundant circuit Grant 5,299,164 - Takeuchi , et al. March 29, 1 | 1994-03-29 |
Sense amplifier circuit having a bias current control means Grant 5,276,369 - Hayakawa , et al. January 4, 1 | 1994-01-04 |
Static random access memory including stress test circuitry Grant 5,276,647 - Matsui , et al. January 4, 1 | 1994-01-04 |
Semiconductor integrated circuit Grant 5,184,031 - Hayakawa , et al. February 2, 1 | 1993-02-02 |
Static random access memory with address transition detector Grant 4,922,461 - Hayakawa , et al. May 1, 1 | 1990-05-01 |
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