Hayakawa; Kohichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hayakawa; Kohichi.The latest application filed is for "inspection method, apparatus and system for circuit pattern".

Company Profile

0.5.6

Hayakawa; Kohichi - Hitachinaka JP
Hayakawa, Kohichi - Hitachinaka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection method, apparatus and system for circuit pattern Grant 6,919,564 - Nara , et al. July 19, 2	2005-07-19
Inspection method, apparatus and system for circuit pattern Grant 6,903,821 - Nara , et al. June 7, 2	2005-06-07
Inspection method, apparatus and system for circuit pattern Grant 6,759,655 - Nara , et al. July 6, 2	2004-07-06
Inspection method, apparatus and system for circuit pattern App 20030058444 - Nara, Yasuhiko ; et al.	2003-03-27
Inspection method, apparatus and system for circuit pattern Grant 6,493,082 - Nara , et al. December 10, 2	2002-12-10
Inspection method, apparatus and system for circuit pattern App 20020113967 - Nara, Yasuhiko ; et al.	2002-08-22
Inspection method, apparatus and system for circuit pattern App 20020109088 - Nara, Yasuhiko ; et al.	2002-08-15
Inspection method, apparatus and system for circuit pattern App 20020105648 - Nara, Yasuhiko ; et al.	2002-08-08
Inspection method, apparatus and system for circuit pattern Grant 6,421,122 - Nara , et al. July 16, 2	2002-07-16
Inspection method, apparatus and system for circuit pattern App 20010019411 - Nara, Yasuhiko ; et al.	2001-09-06
Inspection method, apparatus and system for circuit pattern App 20010011706 - Nara, Yasuhiko ; et al.	2001-08-09

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