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name:-0.0036940574645996
name:-0.00041985511779785
Hay; Jennifer Patent Filings

Hay; Jennifer

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hay; Jennifer.The latest application filed is for "assay device and method".

Company Profile
0.5.4
  • Hay; Jennifer - Knoxville TN
  • Hay; Jennifer - Glasgow N/A GB
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Instrumented indentation apparatus having indenter punch with flat end surface and instrumented indentation method using the same
Grant 10,288,540 - Hay
2019-05-14
Assay device and method
Grant 9,063,132 - Dilleen , et al. June 23, 2
2015-06-23
Scanning probe microscope with independent force control and displacement measurements
Grant 8,028,343 - Oliver , et al. September 27, 2
2011-09-27
Assay Device And Method
App 20110008813 - Dilleen; John William ;   et al.
2011-01-13
Scanning Probe Microscope with Independent Force Control and Displacement Measurements
App 20100192267 - Oliver; Warren C. ;   et al.
2010-07-29
Calibrating force and displacement sensors of mechanical probes
Grant 7,681,432 - Hay , et al. March 23, 2
2010-03-23
Calibrating Force And Displacement Sensors Of Mechanical Probes
App 20080134748 - Hay; Jennifer ;   et al.
2008-06-12
Detecting a significant event in experimental data and use of such for detection of engagement during a mechanical test
App 20040153292 - Hay, Jennifer
2004-08-05

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