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Structured light projection for specular surfaces
Grant 11,421,983 - Rudd , et al. August 23, 2 | 2022-08-23 |
Automatic programming of solder paste inspection system
Grant 11,176,635 - Butler , et al. November 16, 2 | 2021-11-16 |
Structured light projection for specular surfaces
Grant 11,073,380 - Rudd , et al. July 27, 2 | 2021-07-27 |
Three-dimensional Sensor With Counterposed Channels
App 20210088328 - Haugen; Paul R. ; et al. | 2021-03-25 |
Three-dimensional sensor with counterposed channels
Grant 10,883,823 - Haugen , et al. January 5, 2 | 2021-01-05 |
Three-dimensional Sensor With Counterposed Channels
App 20200124407 - Haugen; Paul R. ; et al. | 2020-04-23 |
Three-dimensional Sensor With Counterposed Channels
App 20200124410 - Haugen; Paul R. ; et al. | 2020-04-23 |
Structured Light Projection For Specular Surfaces
App 20190226835 - Rudd; Eric P. ; et al. | 2019-07-25 |
Structured Light Projection For Specular Surfaces
App 20190226836 - Rudd; Eric P. ; et al. | 2019-07-25 |
Point cloud merging from multiple cameras and sources in three-dimensional profilometry
Grant 10,346,963 - Rudd , et al. July 9, 2 | 2019-07-09 |
Updating calibration of a three-dimensional measurement system
Grant 9,816,287 - Zhou , et al. November 14, 2 | 2017-11-14 |
Field Calibration Of Three-dimensional Non-contact Scanning System
App 20170264885 - Haugan; Carl E. ; et al. | 2017-09-14 |
Updating Calibration Of A Three-dimensional Measurement System
App 20160180511 - Zhou; Guangyu ; et al. | 2016-06-23 |
Point Cloud Merging From Multiple Cameras And Sources In Three-dimensional Profilometry
App 20160078610 - Rudd; Eric P. ; et al. | 2016-03-17 |
Dark field illuminator with large working area
Grant 8,894,259 - Haugan , et al. November 25, 2 | 2014-11-25 |
High speed distributed optical sensor inspection system
Grant 8,872,912 - Case , et al. October 28, 2 | 2014-10-28 |
Automatic Programming Of Solder Paste Inspection System
App 20140210993 - Butler; Douglas G. ; et al. | 2014-07-31 |
High speed optical inspection system with adaptive focusing
Grant 8,681,211 - Haugan , et al. March 25, 2 | 2014-03-25 |
High speed optical inspection system with camera array and compact, integrated illuminator
Grant 8,670,031 - Case , et al. March 11, 2 | 2014-03-11 |
High speed, high resolution, three dimensional solar cell inspection system
Grant 8,388,204 - Case , et al. March 5, 2 | 2013-03-05 |
High Speed Optical Sensor Inspection System
App 20120327215 - Case; Steven K. ; et al. | 2012-12-27 |
High Speed, High Resolution, Three Dimensional Printed Circuit Board Inspection System
App 20120133920 - Skunes; Timothy A. ; et al. | 2012-05-31 |
High Speed Distributed Optical Sensor Inspection System
App 20110102575 - Case; Steven K. ; et al. | 2011-05-05 |
High Speed Optical Inspection System With Adaptive Focusing
App 20110090333 - Haugan; Carl E. ; et al. | 2011-04-21 |
High Speed Optical Inspection System With Camera Array And Compact, Integrated Illuminator
App 20110069878 - Case; Steven K. ; et al. | 2011-03-24 |
Dark Field Illuminator With Large Working Area
App 20110069507 - Haugan; Carl E. ; et al. | 2011-03-24 |
High Speed, High Resolution, Three Dimensional Solar Cell Inspection System
App 20110069154 - Case; Steven K. ; et al. | 2011-03-24 |
Solder paste inspection system
Grant 6,750,899 - Fishbaine , et al. June 15, 2 | 2004-06-15 |
Phase profilometry system with telecentric projector
Grant 6,577,405 - Kranz , et al. June 10, 2 | 2003-06-10 |
Phase profilometry system with telecentric projector
App 20010033386 - Kranz, David M. ; et al. | 2001-10-25 |
Method and apparatus for electronic component lead measurement using light based sensors on a component placement machine
Grant 6,118,538 - Haugan , et al. September 12, 2 | 2000-09-12 |
High precision semiconductor component alignment systems
Grant 5,897,611 - Case , et al. April 27, 1 | 1999-04-27 |
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