Hau-Riege; Stefan P.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hau-Riege; Stefan P..The latest application filed is for "method for repairing mask-blank defects using repair-zone compensation".
- Hau-Riege; Stefan P. - Fremont CA
- Hau-Riege; Stefan P. - Milpitas CA
| Patent | Date |
|---|---|
| Tamper to delay motion and decrease ionization of a sample during short pulse x-ray imaging Grant 7,236,565 - London , et al. June 26, 2 | 2007-06-26 |
| Method for repairing mask-blank defects using repair-zone compensation App 20060234135 - Hau-Riege; Stefan P. ; et al. | 2006-10-19 |
| Electromigration-reliability improvement of dual damascene interconnects Grant 7,087,516 - Hau-Riege August 8, 2 | 2006-08-08 |
| Tamper to delay motion and decrease ionization of a sample during short pulse x-ray imaging App 20050276370 - London, Richard A. ; et al. | 2005-12-15 |
| Electromigration-reliability improvement of dual damascene interconnects App 20040067638 - Hau-Riege, Stefan P. | 2004-04-08 |
| Electromigration-reliability improvement of dual damascene interconnects Grant 6,717,268 - Hau-Riege April 6, 2 | 2004-04-06 |
| Electromigration-reliability improvement of dual damascene interconnects App 20030089996 - Hau-Riege, Stefan P. | 2003-05-15 |
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