Hattori; Nobuyoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hattori; Nobuyoshi.The latest application filed is for "information processing device, imaging device, and system".

Company Profile

1.18.14

Hattori; Nobuyoshi - Tokyo JP
Hattori; Nobuyoshi - Kanagawa JP
Hattori; Nobuyoshi - Itami JP
Hattori, Nobuyoshi - Chiyoda-ku JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Information processing device, imaging device, and system Grant 10,868,921 - Aizawa , et al. December 15, 2	2020-12-15
Information Processing Device, Imaging Device, And System App 20190149673 - AIZAWA; Tatsuya ; et al.	2019-05-16
Sheet processing apparatus and image forming system Grant 8,814,156 - Hattori August 26, 2	2014-08-26
Sheet Processing Apparatus And Image Forming System App 20130313770 - HATTORI; Nobuyoshi	2013-11-28
Semiconductor Device And Method Of Manufacturing The Same App 20120302061 - ARIE; Hiroyuki ; et al.	2012-11-29
Semiconductor device and method of manufacturing the same Grant 8,242,605 - Arie , et al. August 14, 2	2012-08-14
Semiconductor Device And Method Of Manufacturing The Same App 20100327349 - ARIE; Hiroyuki ; et al.	2010-12-30
Method of manufacturing a semiconductor device Grant 7,674,668 - Ishitsuka , et al. March 9, 2	2010-03-09
Method of manufacturing a semiconductor device App 20080188043 - Ishitsuka; Norio ; et al.	2008-08-07
Semiconductor device and method of manufacturing the same App 20050212056 - Iwamatsu, Toshiaki ; et al.	2005-09-29
Semiconductor device and method of manufacturing the same Grant 6,914,307 - Iwamatsu , et al. July 5, 2	2005-07-05
Method of manufacturing SOI wafer Grant 6,844,242 - Naruoka , et al. January 18, 2	2005-01-18
Computer-implemented method of process analysis Grant 6,769,111 - Mugibayashi , et al. July 27, 2	2004-07-27
Computer-implemented method of defect analysis Grant 6,741,940 - Mugibayashi , et al. May 25, 2	2004-05-25
Semiconductor device and method of manufacturing the same App 20040046216 - Iwamatsu, Toshiaki ; et al.	2004-03-11
Semiconductor device Grant 6,646,306 - Iwamatsu , et al. November 11, 2	2003-11-11
Computer-implemented method of process analysis App 20030065411 - Mugibayashi, Toshiaki ; et al.	2003-04-03
Computer-implemented method of defect analysis App 20030060985 - Mugibayashi, Toshiaki ; et al.	2003-03-27
Method of manufacturing SOI wafer App 20030013273 - Naruoka, Hideki ; et al.	2003-01-16
Defect analysis method and process control method Grant 6,473,665 - Mugibayashi , et al. October 29, 2	2002-10-29
SOI substrate and semiconductor device Grant 6,465,316 - Hattori , et al. October 15, 2	2002-10-15
Semiconductor device and method of manufacturing the same App 20020060320 - Iwamatsu, Toshiaki ; et al.	2002-05-23
Method of manufacturing SOI substrate and semiconductor device Grant 6,372,593 - Hattori , et al. April 16, 2	2002-04-16
SOI substrate and semiconductor device App 20020019105 - Hattori, Nobuyoshi ; et al.	2002-02-14
Defect analysis method and process control method Grant 6,341,241 - Mugibayashi , et al. January 22, 2	2002-01-22
Defect analysis method and process control method App 20020002415 - Mugibayashi, Toshiaki ; et al.	2002-01-03
Semiconductor device and semiconductor storage device Grant 6,252,294 - Hattori , et al. June 26, 2	2001-06-26
Quality management system and recording medium Grant 6,202,037 - Hattori , et al. March 13, 2	2001-03-13
Inspection data analyzing apparatus for in-line inspection with enhanced display of inspection results Grant 6,016,562 - Miyazaki , et al. January 18, 2	2000-01-18
Apparatus for counting particles attached to surfaces of a solid Grant 4,893,320 - Yanagi , et al. January 9, 1	1990-01-09

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