Hatano; Hisashi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hatano; Hisashi.The latest application filed is for "manifold".
- Hatano; Hisashi - Aichi JP
- Hatano; Hisashi - Tokyo JP
- Hatano; Hisashi - Komaki JP
- Hatano; Hisashi - Hitachinaka N/A JP
- Hatano; Hisashi - Kamisato JP
| Patent | Date |
|---|---|
| Manifold App 20210262599 - Hatano; Hisashi ; et al. | 2021-08-26 |
| Defect inspection device and defect inspection method Grant 10,861,145 - Honda , et al. December 8, 2 | 2020-12-08 |
| Flaw inspection device and flaw inspection method Grant 10,816,484 - Honda , et al. October 27, 2 | 2020-10-27 |
| Holder for solenoid valves Grant D886,741 - Okajima , et al. | 2020-06-09 |
| Data transmission device Grant D886,102 - Okajima , et al. | 2020-06-02 |
| Connector for solenoid valves Grant D884,637 - Okajima , et al. | 2020-05-19 |
| Data communication device Grant D883,978 - Okajima , et al. | 2020-05-12 |
| Connector for solenoid valves Grant D883,214 - Okajima , et al. | 2020-05-05 |
| Flaw Inspection Device And Flaw Inspection Method App 20200057003 - Honda; Toshifumi ; et al. | 2020-02-20 |
| Power supply unit Grant D867,990 - Okajima , et al. Nov | 2019-11-26 |
| Flaw inspection device and flaw inspection method Grant 10,466,181 - Honda , et al. No | 2019-11-05 |
| Defect Inspection Device And Defect Inspection Method App 20190206047 - HONDA; Toshifumi ; et al. | 2019-07-04 |
| Flaw Inspection Device And Flaw Inspection Method App 20190094155 - HONDA; Toshifumi ; et al. | 2019-03-28 |
| Defect inspection device, display device, and defect classification device Grant 9,964,500 - Hatano , et al. May 8, 2 | 2018-05-08 |
| Inspection apparatus Grant 9,933,370 - Ito , et al. April 3, 2 | 2018-04-03 |
| Defect Inspection Device, Display Device, and Defect Classification Device App 20170328846 - HATANO; Hisashi ; et al. | 2017-11-16 |
| Defect inspection method and device for same Grant 9,488,596 - Honda , et al. November 8, 2 | 2016-11-08 |
| Surface Shape Measuring Apparatus App 20160178360 - ITO; Masaaki ; et al. | 2016-06-23 |
| Defect Inspection Method And Device For Same App 20160109382 - Honda; Toshifumi ; et al. | 2016-04-21 |
| Surface shape measuring apparatus Grant 9,310,190 - Ito , et al. April 12, 2 | 2016-04-12 |
| Defect inspection method and device for same Grant 9,255,888 - Honda , et al. February 9, 2 | 2016-02-09 |
| Apparatus and method for inspecting pattern defect Grant 9,182,359 - Hatano , et al. November 10, 2 | 2015-11-10 |
| Inspection Apparatus App 20150109435 - ITO; Masaaki ; et al. | 2015-04-23 |
| Inspection apparatus Grant 8,902,417 - Hirose , et al. December 2, 2 | 2014-12-02 |
| Defect Inspection Method And Device For Same App 20140253912 - Honda; Toshifumi ; et al. | 2014-09-11 |
| Surface Shape Measuring Apparatus App 20140198321 - Ito; Masaaki ; et al. | 2014-07-17 |
| Inspection Apparatus App 20130271754 - Hirose; Nobuaki ; et al. | 2013-10-17 |
| Apparatus And Method For Inspecting Pattern Defect App 20120268742 - Hatano; Hisashi ; et al. | 2012-10-25 |
| Method of apparatus for detecting particles on a specimen Grant 8,289,507 - Hamamatsu , et al. October 16, 2 | 2012-10-16 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20110228258 - HAMAMATSU; Akira ; et al. | 2011-09-22 |
| Method of apparatus for detecting particles on a specimen Grant 7,952,700 - Hamamatsu , et al. May 31, 2 | 2011-05-31 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20110032515 - HAMAMATSU; Akira ; et al. | 2011-02-10 |
| Method of apparatus for detecting particles on a specimen Grant 7,817,261 - Hamamatsu , et al. October 19, 2 | 2010-10-19 |
| Method Of Apparatus For Detecting Particles On A Specimen App 20080204724 - Hamamatsu; Akira ; et al. | 2008-08-28 |
| Method of apparatus for detecting particles on a specimen Grant 7,369,223 - Hamamatsu , et al. May 6, 2 | 2008-05-06 |
| Method of apparatus for detecting particles on a specimen App 20050213086 - Hamamatsu, Akira ; et al. | 2005-09-29 |
| Fire detector Grant D319,798 - Hatano September 10, 1 | 1991-09-10 |
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