HASUDA; Masakatsu
Patent Applications and Registrations
Patent applications and USPTO patent grants for HASUDA; Masakatsu.The latest application filed is for "mask defect repair apparatus and mask defect repair method".
- HASUDA; Masakatsu - Kanagawa JP
- Hasuda; Masakatsu - Tokyo JP
- Hasuda; Masakatsu - Chiba JP
- Hasuda; Masakatsu - Chiba-shi JP
| Patent | Date |
|---|---|
| Mask Defect Repair Apparatus And Mask Defect Repair Method App 20200310246 - NAKAGAWA; Yoshitomo ; et al. | 2020-10-01 |
| Charged particle beam apparatus Grant 10,468,228 - Hasuda No | 2019-11-05 |
| Charged Particle Beam Apparatus App 20180286628 - HASUDA; Masakatsu | 2018-10-04 |
| Sample carrying device and vacuum apparatus Grant 9,885,639 - Hasuda , et al. February 6, 2 | 2018-02-06 |
| Composite Charged Particle Beam Apparatus App 20170271119 - OONISHI; Tsuyoshi ; et al. | 2017-09-21 |
| Transport Device, Treatment Device, Vacuum Device, And Charged Particle Beam Device App 20170062174 - Iwahori; Toshiyuki ; et al. | 2017-03-02 |
| Sample Carrying Device And Vacuum Apparatus App 20160223434 - HASUDA; Masakatsu ; et al. | 2016-08-04 |
| Charged particle beam apparatus and sample transporting apparatus Grant 8,674,324 - Hasuda March 18, 2 | 2014-03-18 |
| Electron microscope and specimen analyzing method Grant 8,664,598 - Hasuda , et al. March 4, 2 | 2014-03-04 |
| Composite charged particle beam apparatus and sample processing and observing method Grant 8,642,958 - Takahashi , et al. February 4, 2 | 2014-02-04 |
| Charged Particle Beam Apparatus And Sample Transporting Apparatus App 20130240730 - HASUDA; Masakatsu | 2013-09-19 |
| Composite charged particle beam apparatus and sample processing and observing method App 20110226947 - Takahashi; Haruo ; et al. | 2011-09-22 |
| Electron microscope and specimen analyzing method App 20110186734 - Hasuda; Masakatsu ; et al. | 2011-08-04 |
| Sample holding mechanism and sample working/observing apparatus Grant 7,574,932 - Hasuda , et al. August 18, 2 | 2009-08-18 |
| Thermal analysis apparatus Grant 7,500,779 - Takeuchi , et al. March 10, 2 | 2009-03-10 |
| Sample holding mechanism and sample working/observing apparatus App 20080224374 - Hasuda; Masakatsu ; et al. | 2008-09-18 |
| Ion beam device and ion beam processing method, and holder member Grant 7,297,944 - Kodama , et al. November 20, 2 | 2007-11-20 |
| Ion beam device and ion beam processing method Grant 7,276,691 - Kodama , et al. October 2, 2 | 2007-10-02 |
| Thermal analysis apparatus App 20070201533 - Takeuchi; Toshitada ; et al. | 2007-08-30 |
| Ion beam device and ion beam processing method App 20060163497 - Kodama; Toshio ; et al. | 2006-07-27 |
| Ion beam device and ion beam processing method, and holder member App 20050236587 - Kodama, Toshio ; et al. | 2005-10-27 |
| Ion beam apparatus, ion beam processing method and sample holder member Grant 6,838,685 - Kodama , et al. January 4, 2 | 2005-01-04 |
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