Hashimi; Kazuo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hashimi; Kazuo.The latest application filed is for "heat conduction structure or semiconductor apparatus".

Company Profile

0.13.10

Hashimi; Kazuo - Nagoya JP
HASHIMI; Kazuo - Nagoya-shi JP
Hashimi; Kazuo - Kawasaki N/A JP
Hashimi; Kazuo - Yokohama JP
Hashimi; Kazuo - Kuwana JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Heat conduction structure or semiconductor apparatus Grant 11,075,140 - Bessho , et al. July 27, 2	2021-07-27
Heat Conduction Structure Or Semiconductor Apparatus App 20200006195 - BESSHO; Takeshi ; et al.	2020-01-02
Semiconductor device with inverted trapezoidal cross sectional profile in surface areas of substrate Grant 8,809,919 - Hashimi , et al. August 19, 2	2014-08-19
Manufacturing method of semiconductor device and semiconductor manufacturing apparatus Grant 8,685,265 - Nakao , et al. April 1, 2	2014-04-01
Semiconductor wafer having W-shaped dummy metal filling section within monitor region Grant 8,592,951 - Hashimi , et al. November 26, 2	2013-11-26
Manufacturing Method Of Semiconductor Device And Semiconductor Manufacturing Apparatus App 20120288969 - Nakao; Yoshiyuki ; et al.	2012-11-15
Method For Evaluating Impurity Distribution Under Gate Electrode Without Damaging Silicon Substrate App 20120181671 - Hashimi; Kazuo ; et al.	2012-07-19
Semiconductor Device And Fabrication Method Thereof App 20120104477 - Hashimi; Kazuo ; et al.	2012-05-03
Method for evaluating impurity distribution under gate electrode without damaging silicon substrate Grant 8,163,572 - Hashimi , et al. April 24, 2	2012-04-24
Semiconductor device and fabrication method thereof Grant 8,114,764 - Hashimi , et al. February 14, 2	2012-02-14
Method for evaluating impurity distribution under gate electrode without damaging silicon substrate Grant 7,691,649 - Hashimi , et al. April 6, 2	2010-04-06
Semiconductor Device And Fabrication Method Thereof App 20100072522 - HASHIMI; Kazuo ; et al.	2010-03-25
Method For Evaluating Impurity Distribution Under Gate Electrode Without Damaging Silicon Substrate App 20100065947 - Hashimi; Kazuo ; et al.	2010-03-18
Semiconductor device and fabrication method thereof Grant 7,642,192 - Hashimi , et al. January 5, 2	2010-01-05
Semiconductor device, a manufacturing method thereof, and an evaluation method of the semiconductor device App 20070138561 - Hashimi; Kazuo ; et al.	2007-06-21
Semiconductor device and fabrication method thereof App 20060006477 - Hashimi; Kazuo ; et al.	2006-01-12
Semiconductor device and method of manufacturing the same Grant 6,528,413 - Hashimi March 4, 2	2003-03-04
Semiconductor device and method of manufacturing the same App 20020177304 - Hashimi, Kazuo	2002-11-28

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