Hasegawa; Izumi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hasegawa; Izumi.The latest application filed is for "substrate defect inspection apparatus, method of adjusting sensitivity parameter value for substrate defect inspection, and non-transitory storage medium".

Company Profile

1.14.12

Hasegawa; Izumi - Koshi JP
Hasegawa; Izumi - Koshi City JP
Hasegawa; Izumi - Kanagawa JP
HASEGAWA; Izumi - Koshi-Shi JP
Hasegawa; Izumi - Tamana-gun JP
Hasegawa; Izumi - Kawasaki JP
Hasegawa; Izumi - Yokohama JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Substrate defect inspection apparatus, method of adjusting sensitivity parameter value for substrate defect inspection, and non-transitory storage medium Grant 10,249,034 - Kitada , et al.	2019-04-02
Substrate Defect Inspection Apparatus, Method Of Adjusting Sensitivity Parameter Value For Substrate Defect Inspection, And Non-transitory Storage Medium App 20180005370 - Kitada; Yasuhiro ; et al.	2018-01-04
Liquid treatment method, substrate processing apparatus and non-transitory storage medium Grant 9,766,543 - Kunugimoto , et al. September 19, 2	2017-09-19
Electrical connector Grant 9,437,988 - McGrath , et al. September 6, 2	2016-09-06
Defect analyzing apparatus, substrate processing system, defect analyzing method and computer-readable storage medium Grant 9,342,880 - Iwanaga , et al. May 17, 2	2016-05-17
Electrical Connector App 20160111833 - McGrath; James L. ; et al.	2016-04-21
Electrical connector with two signal and two grounding contact ends alternately positioned in two rows Grant 9,306,339 - Hasegawa , et al. April 5, 2	2016-04-05
Substrate reference image creation method, substrate defect inspection method, substrate reference image creation apparatus, substrate defect inspection unit and non-transitory computer storage medium Grant 9,146,479 - Hasegawa , et al. September 29, 2	2015-09-29
Liquid Treatment Method, Substrate Processing Apparatus And Non-transitory Storage Medium App 20150234277 - KUNUGIMOTO; Yuichiro ; et al.	2015-08-20
Electrical connector having a ground contact with a solder portion and a pair of grounding contact portions Grant 9,065,214 - Nakashima , et al. June 23, 2	2015-06-23
Defect Analyzing Apparatus, Substrate Processing System, Defect Analyzing Method And Computer-readable Storage Medium App 20150125068 - Iwanaga; Shuji ; et al.	2015-05-07
Electrical Connector App 20150079843 - Nakashima; Takeshi ; et al.	2015-03-19
Electrical Connector App 20150031242 - Hasegawa; Izumi ; et al.	2015-01-29
Substrate treatment apparatus, substrate treatment method and non-transitory storage medium Grant 8,885,140 - Nakashima , et al. November 11, 2	2014-11-11
Electrical connector Grant D713,349 - Igarashi , et al. September 16, 2	2014-09-16
Substrate Reference Image Creation Method, Substrate Defect Inspection Method, Substrate Reference Image Creation Apparatus, Substrate Defect Inspection Unit And Non-transitory Computer Storage Medium App 20140160451 - HASEGAWA; Izumi ; et al.	2014-06-12
Substrate Treatment Apparatus, Substrate Treatment Method And Non-transitory Storage Medium App 20130057836 - NAKASHIMA; Tomohiro ; et al.	2013-03-07
Electrical Component App 20120009827 - Hasegawa; Izumi ; et al.	2012-01-12
Electrical connector and electrical connector assembly Grant 6,984,137 - Akasaka , et al. January 10, 2	2006-01-10
Electrical connector assembly App 20050142922 - Akasaka, Junya ; et al.	2005-06-30
Electrical connector and electrical connector assembly App 20050142909 - Akasaka, Junya ; et al.	2005-06-30
Apparatus and method for supplying a process solution Grant 6,193,783 - Sakamoto , et al. February 27, 2	2001-02-27
Noise filter connector Grant 4,995,834 - Hasegawa February 26, 1	1991-02-26
Electrical connector for an electrical cable Grant 4,820,175 - Hasegawa , et al. April 11, 1	1989-04-11

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