loadpatents
Patent applications and USPTO patent grants for Hasebe; Takehiko.The latest application filed is for "metal recovery method and dialysis device".
Patent | Date |
---|---|
Metal recovery method and dialysis device Grant 8,992,665 - Yamaguchi , et al. March 31, 2 | 2015-03-31 |
Metal Recovery Method and Dialysis Device App 20120312126 - Yamaguchi; Yoshihide ;   et al. | 2012-12-13 |
Semiconductor Chip Used For Evaluation, Evaluation System, And Repairing Method Thereof App 20110237001 - HASEBE; Takehiko ;   et al. | 2011-09-29 |
Actuator system Grant 7,567,019 - Yamanaka , et al. July 28, 2 | 2009-07-28 |
Pattern Formation Method App 20090111062 - Kato; Masako ;   et al. | 2009-04-30 |
Electronic Apparatus App 20090008128 - Hasebe; Takehiko ;   et al. | 2009-01-08 |
Electronic apparatus Grant 7,425,762 - Hasebe , et al. September 16, 2 | 2008-09-16 |
Actuator system App 20080088208 - Yamanaka; Kiyoka ;   et al. | 2008-04-17 |
Semiconductor chip with coil antenna and communication system Grant 7,355,270 - Hasebe , et al. April 8, 2 | 2008-04-08 |
Fabrication method of semiconductor integrated circuit device Grant 7,351,597 - Wada , et al. April 1, 2 | 2008-04-01 |
Fabrication Method Of Semiconductor Integrated Circuit Device App 20070218572 - Wada; Yuji ;   et al. | 2007-09-20 |
Fabrication method of semiconductor integrated circuit device Grant 7,219,422 - Wada , et al. May 22, 2 | 2007-05-22 |
Electronic apparatus App 20070080447 - Hasebe; Takehiko ;   et al. | 2007-04-12 |
Probe memory device and positioning method therefor App 20070030791 - Hasebe; Takehiko ;   et al. | 2007-02-08 |
Electronic apparatus Grant 7,145,231 - Hasebe , et al. December 5, 2 | 2006-12-05 |
Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method Grant 7,049,837 - Kasukabe , et al. May 23, 2 | 2006-05-23 |
Semiconductor chip with coil antenna and communication system App 20050173532 - Hasebe, Takehiko ;   et al. | 2005-08-11 |
Electronic apparatus App 20040207073 - Hasebe, Takehiko ;   et al. | 2004-10-21 |
Fabrication method of semiconductor integrated circuit device App 20040183556 - Wada, Yuji ;   et al. | 2004-09-23 |
Electronic apparatus Grant 6,744,135 - Hasebe , et al. June 1, 2 | 2004-06-01 |
Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method App 20040070413 - Kasukabe, Susumu ;   et al. | 2004-04-15 |
Multi-layer wiring substrate and manufacturing method thereof App 20030019663 - Shigi, Hidetaka ;   et al. | 2003-01-30 |
Multi-layer wiring substrate and manufacturing method thereof Grant 6,506,982 - Shigi , et al. January 14, 2 | 2003-01-14 |
Electronic apparatus App 20030002260 - Hasebe, Takehiko ;   et al. | 2003-01-02 |
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