Hasebe; Shinichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Hasebe; Shinichi.The latest application filed is for "ic test system".
- Hasebe; Shinichi - Yamagata JP
- Hasebe; Shinichi - Yamagata-shi JP
- Hasebe; Shinichi - Saitama-ken JP
- Hasebe; Shinichi - Kitaadachi-gun JP
| Patent | Date |
|---|---|
| IC test system Grant 10,527,669 - Matsumoto , et al. J | 2020-01-07 |
| Ic Test System App 20180267097 - Matsumoto; Shouhei ; et al. | 2018-09-20 |
| Receiving LSI device and receiver using the same Grant 7,457,383 - Hasebe , et al. November 25, 2 | 2008-11-25 |
| Multi-function IC card Grant 7,126,371 - Nakano , et al. October 24, 2 | 2006-10-24 |
| Receiving LSI device and receiver using the same App 20050286658 - Hasebe, Shinichi ; et al. | 2005-12-29 |
| Multi-function IC card App 20040078661 - Nakano, Hiroo ; et al. | 2004-04-22 |
| Semiconductor integrated circuit, memory card having the semiconductor integrated circuit and method of using the memory card App 20030075601 - Yagi, Hideki ; et al. | 2003-04-24 |
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