Harwood; Warren K
Patent Applications and Registrations
Patent applications and USPTO patent grants for Harwood; Warren K.The latest application filed is for "wafer probe station having environment control enclosure".
Company Profile
0.25.15
- Harwood; Warren K - Vancouver WA
- Harwood; Warren K. - Vancouver WA
Patent Activity
| Patent | Date |
|---|---|
| Print media pressure plates Grant 11,225,091 - Boucher , et al. January 18, 2 | 2022-01-18 |
| Wafer probe station having environment control enclosure Grant 7,595,632 - Harwood , et al. September 29, 2 | 2009-09-29 |
| Wafer probe station having a skirting component Grant 7,589,518 - Schwindt , et al. September 15, 2 | 2009-09-15 |
| Wafer probe station having a skirting component Grant 7,492,147 - Schwindt , et al. February 17, 2 | 2009-02-17 |
| Wafer probe station having environment control enclosure App 20080106290 - Harwood; Warren K. ; et al. | 2008-05-08 |
| Wafer probe station having environment control enclosure Grant 7,348,787 - Harwood , et al. March 25, 2 | 2008-03-25 |
| Wafer probe station having a skirting component Grant 7,330,023 - Schwindt , et al. February 12, 2 | 2008-02-12 |
| Wafer probe station having a skirting component App 20070290700 - Schwindt; Randy J. ; et al. | 2007-12-20 |
| Wafer probe station having environment control enclosure App 20060132157 - Harwood; Warren K. ; et al. | 2006-06-22 |
| Wafer probe station having environment control enclosure Grant 7,009,383 - Harwood , et al. March 7, 2 | 2006-03-07 |
| Wafer probe station for low-current measurements Grant 6,980,012 - Schwindt , et al. December 27, 2 | 2005-12-27 |
| Wafer probe station having a skirting component App 20050194983 - Schwindt, Randy J. ; et al. | 2005-09-08 |
| Wafer probe station having a skirting component App 20050184744 - Schwindt, Randy J. ; et al. | 2005-08-25 |
| Wafer probe station having environment control enclosure App 20050017741 - Harwood, Warren K. ; et al. | 2005-01-27 |
| Wafer probe station having environment control enclosure Grant 6,801,047 - Harwood , et al. October 5, 2 | 2004-10-05 |
| Wafer probe station for low-current measurements Grant 6,720,782 - Schwindt , et al. April 13, 2 | 2004-04-13 |
| Wafer probe station for low-current measurements App 20040061514 - Schwindt, Randy J. ; et al. | 2004-04-01 |
| Wafer probe station having environment control enclosure App 20030205997 - Harwood, Warren K. ; et al. | 2003-11-06 |
| Wafer probe station having environment control enclosure Grant 6,636,059 - Harwood , et al. October 21, 2 | 2003-10-21 |
| Wafer probe station for low-current measurements App 20030057979 - Schwindt, Randy J. ; et al. | 2003-03-27 |
| Wafer probe station having environment control enclosure App 20030048110 - Harwood, Warren K. ; et al. | 2003-03-13 |
| Wafer probe station for low-current measurements Grant 6,492,822 - Schwindt , et al. December 10, 2 | 2002-12-10 |
| Wafer probe station having environment control enclosure Grant 6,486,687 - Harwood , et al. November 26, 2 | 2002-11-26 |
| Wafer probe station having environment control enclosure App 20020093353 - Harwood, Warren K. ; et al. | 2002-07-18 |
| Wafer probe station having environment control enclosure Grant 6,380,751 - Harwood , et al. April 30, 2 | 2002-04-30 |
| Wafer probe station for low-current measurements App 20020043981 - Schwindt, Randy J. ; et al. | 2002-04-18 |
| Wafer probe station for low-current measurements Grant 6,335,628 - Schwindt , et al. January 1, 2 | 2002-01-01 |
| Wafer probe station having environment control enclosure App 20010040461 - Harwood, Warren K. ; et al. | 2001-11-15 |
| Wafer probe station having environment control enclosure Grant 6,313,649 - Harwood , et al. November 6, 2 | 2001-11-06 |
| Wafer probe station for low-current measurements App 20010009377 - Schwindt, Randy J. ; et al. | 2001-07-26 |
| Wafer Probe Station Having Environment Control Enclosure App 20010001538 - HARWOOD, WARREN K. ; et al. | 2001-05-24 |
| Wafer probe station for low-current measurements Grant 6,232,788 - Schwindt , et al. May 15, 2 | 2001-05-15 |
| Wafer probe station for low-current measurements Grant 5,663,653 - Schwindt , et al. September 2, 1 | 1997-09-02 |
| Wafer probe station having environment control enclosure Grant 5,604,444 - Harwood , et al. February 18, 1 | 1997-02-18 |
| Wafer probe station having environment control enclosure Grant 5,532,609 - Harwood , et al. July 2, 1 | 1996-07-02 |
| Wafer probe station having full guarding Grant 5,457,398 - Schwindt , et al. October 10, 1 | 1995-10-10 |
| Wafer probe station having integrated guarding, Kelvin connection and shielding systems Grant 5,434,512 - Schwindt , et al. July 18, 1 | 1995-07-18 |
| Wafer probe station having integrated guarding, Kelvin connection and shielding systems Grant 5,345,170 - Schwindt , et al. September 6, 1 | 1994-09-06 |
| Wafer probe station with integrated environment control enclosure Grant 5,266,889 - Harwood , et al. November 30, 1 | 1993-11-30 |
| Wafer probe station having auxiliary chucks Grant 5,237,267 - Harwood , et al. August 17, 1 | 1993-08-17 |
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