Hartfield; Cheryl

Patent Applications and Registrations

Patent applications and USPTO patent grants for Hartfield; Cheryl.The latest application filed is for "rapid tem sample preparation method with backside fib milling".

Company Profile

0.10.12

Hartfield; Cheryl - Oxon GB
Hartfield; Cheryl - Plano TX
Hartfield; Cheryl - Dallas TX
Hartfield; Cheryl - McKinney TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of reducing the thickness of a target sample Grant 9,704,689 - Lang , et al. July 11, 2	2017-07-11
Rapid Tem Sample Preparation Method With Backside Fib Milling App 20160189929 - Hammer; Matt ; et al.	2016-06-30
Total release method for sample extraction in an energetic-beam instrument Grant 9,349,573 - Kruger , et al. May 24, 2	2016-05-24
Method Of Reducing The Thickness Of A Target Sample App 20160093468 - LANG; Christian ; et al.	2016-03-31
Total Release Method For Sample Extraction In An Energetic-beam Instrument App 20160035540 - Kruger; Rocky ; et al.	2016-02-04
Gas Injection System For Energetic-beam Instruments App 20150318141 - Kruger; Rocky ; et al.	2015-11-05
Gas injection system for energetic-beam instruments Grant 9,097,625 - Kruger , et al. August 4, 2	2015-08-04
Gas Injection System For Energetic-beam Instruments App 20140014742 - Kruger; Rocky ; et al.	2014-01-16
Method for extracting frozen specimens and manufacture of specimen assemblies Grant 8,513,622 - Hartfield August 20, 2	2013-08-20
Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images Grant 8,440,969 - Moore , et al. May 14, 2	2013-05-14
Method For Extracting Frozen Specimens And Manufacture Of Specimen Assemblies App 20130091875 - Hartfield; Cheryl	2013-04-18
Method And Apparatus For Acquiring Simultaneous And Overlapping Optical And Charged Particle Beam Images App 20120025075 - Moore; Thomas M. ; et al.	2012-02-02
Statistical method for identifying microcracks in insulators Grant 7,225,681 - Stillman , et al. June 5, 2	2007-06-05
Statistical method for identifying microcracks in insulators App 20060273780 - Stillman; Daniel J. ; et al.	2006-12-07
Method of improving contact resistance App 20040115934 - Broz, Jerry ; et al.	2004-06-17
Method for chemically reworking metal layers on integrated circuit bond pads Grant 6,435,398 - Hartfield , et al. August 20, 2	2002-08-20
Method for sample separation and lift-out with one cut Grant 6,420,722 - Moore , et al. July 16, 2	2002-07-16
Method for chemically reworking metal layers on integrated circuit bond pads App 20010050303 - Hartfield, Cheryl ; et al.	2001-12-13
Method for sample separation and lift-out App 20010045511 - Moore, Thomas M. ; et al.	2001-11-29

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