HARAGUCHI; Masaru

Patent Applications and Registrations

Patent applications and USPTO patent grants for HARAGUCHI; Masaru.The latest application filed is for "circuit assembly".

Company Profile

12.28.30

HARAGUCHI; Masaru - Tokyo JP
Haraguchi; Masaru - Hsinchu County TW
Haraguchi; Masaru - Osaka JP
Haraguchi; Masaru - Kanagawa JP
Haraguchi; Masaru - Chiyoda-ku JP
Haraguchi; Masaru - Hyogo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Circuit Assembly App 20220302021 - CHEN; Wenliang ; et al.	2022-09-22
Method for manufacturing semiconductor structure Grant 11,417,628 - Chen , et al. August 16, 2	2022-08-16
Circuit assembly Grant 11,380,614 - Chen , et al. July 5, 2	2022-07-05
Method For Manufacturing Semiconductor Structure App 20210398943 - CHEN; WENLIANG ; et al.	2021-12-23
Semiconductor memory device Grant 11,200,945 - Kubo , et al. December 14, 2	2021-12-14
Capacitor device and manufacturing method therefor Grant 11,038,012 - Haraguchi , et al. June 15, 2	2021-06-15
Semiconductor memory device comprising an interface conforming to JEDEC standard and control device therefor Grant 10,991,418 - Haraguchi , et al. April 27, 2	2021-04-27
Circuit system having compact decoupling structure Grant 10,978,413 - Haraguchi , et al. April 13, 2	2021-04-13
Capacitor Device And Manufacturing Method Therefor App 20210050410 - HARAGUCHI; Masaru ; et al.	2021-02-18
Method For Manufacturing Semiconductor Structure App 20200402951 - CHEN; WENLIANG ; et al.	2020-12-24
Circuit Assembly App 20200402903 - CHEN; Wenliang ; et al.	2020-12-24
Semiconductor memory device for preventing occurrence of row hammer issue Grant 10,818,337 - Kuramori , et al. October 27, 2	2020-10-27
Control Device, Semiconductor Memory Device And Control Method For A Semiconductor Memory Device App 20200135261 - Haraguchi; Masaru ; et al.	2020-04-30
Circuit System Having Compact Decoupling Structure App 20200105688 - HARAGUCHI; Masaru ; et al.	2020-04-02
Capacitor Device And Manufacturing Method Therefor App 20200098853 - HARAGUCHI; Masaru ; et al.	2020-03-26
Semiconductor Memory Device App 20190378561 - KUBO; TAKASHI ; et al.	2019-12-12
Semiconductor Memory Device For Preventing Occurance Of Row Hammer Issue App 20190362774 - KURAMORI; Bunsho ; et al.	2019-11-28
Circuit System Having Compact Decoupling Structure App 20190198460 - HARAGUCHI; Masaru ; et al.	2019-06-27
Data processing system with selective engagement of standby mode based on comparison with a break-even time Grant 9,921,638 - Haraguchi , et al. March 20, 2	2018-03-20
Data processing device and data processing method thereof Grant 9,558,151 - Murata , et al. January 31, 2	2017-01-31
Data processing system, microcontroller and semiconductor device Grant 9,360,922 - Haraguchi , et al. June 7, 2	2016-06-07
Data Processing System App 20150095672 - HARAGUCHI; Masaru ; et al.	2015-04-02
Data Processing System, Microcontroller And Semiconductor Device App 20150095684 - HARAGUCHI; Masaru ; et al.	2015-04-02
Data Processing Device And Data Processing Method Thereof App 20120265964 - MURATA; Kan ; et al.	2012-10-18
Processor And Image Processing System Using The Same App 20120113271 - Haraguchi; Masaru	2012-05-10
Semiconductor device which transmits or receives a signal to or from an external memory by a DDR system Grant 7,983,112 - Haraguchi , et al. July 19, 2	2011-07-19
Interface Circuit App 20100257324 - Osawa; Tokuya ; et al.	2010-10-07
Interface circuit Grant 7,724,606 - Osawa , et al. May 25, 2	2010-05-25
Semiconductor device and impedance adjusting method thereof Grant 7,535,251 - Morishima , et al. May 19, 2	2009-05-19
Semiconductor memory device storing redundant replacement information with small occupation area Grant 7,433,251 - Haraguchi , et al. October 7, 2	2008-10-07
Semiconductor device App 20080181047 - Haraguchi; Masaru ; et al.	2008-07-31
Semiconductor Device And Impedance Adjusting Method Thereof App 20080068040 - Morishima; Chikayoshi ; et al.	2008-03-20
Interface circuit App 20080031079 - Osawa; Tokuya ; et al.	2008-02-07
Semiconductor Memory Device Storing Redundant Replacement Information With Small Occupation Area App 20070242506 - Haraguchi; Masaru ; et al.	2007-10-18
Semiconductor memory device storing redundant replacement information with small occupation area Grant 7,254,069 - Haraguchi , et al. August 7, 2	2007-08-07
Semiconductor memory device with common I/O type circuit configuration achieving write before sense operation Grant 7,064,993 - Gyohten , et al. June 20, 2	2006-06-20
Test circuit capable of testing embedded memory with reliability Grant 7,007,215 - Kinoshita , et al. February 28, 2	2006-02-28
Semiconductor memory device with read and/or write column select gate Grant 6,930,940 - Haraguchi August 16, 2	2005-08-16
Semiconductor memory device with common I/O type circuit configuration achieving write before sense operation App 20040213064 - Gyohten, Takayuki ; et al.	2004-10-28
Semiconductor memory device with read and/or write column select gate App 20040196692 - Haraguchi, Masaru	2004-10-07
Semiconductor memory device with power consumption reduced in non-data-access Grant 6,781,903 - Mangyo , et al. August 24, 2	2004-08-24
Circuit for reducing test time and semiconductor memory device including the circuit Grant 6,779,139 - Haraguchi , et al. August 17, 2	2004-08-17
Semiconductor memory device with power consumption reduced in non-data-access App 20040081009 - Mangyo, Atsuo ; et al.	2004-04-29
Semiconductor test circuit for testing a semiconductor memory device having a write mask function Grant 6,704,229 - Haraguchi , et al. March 9, 2	2004-03-09
Semiconductor memory device storing redundant replacement information with small occupation area App 20040022110 - Haraguchi, Masaru ; et al.	2004-02-05
Test circuit device capable of identifying error in stored data at memory cell level and semiconductor integrated circuit device including the same Grant 6,650,583 - Haraguchi , et al. November 18, 2	2003-11-18
Semiconductor memory device having write column select gate Grant 6,643,214 - Taito , et al. November 4, 2	2003-11-04
Semiconductor memory device having write column select gate App 20030123310 - Taito, Yasuhiko ; et al.	2003-07-03
Semiconductor test circuit for testing a semiconductor memory device having a write mask function App 20030043663 - Haraguchi, Masaru ; et al.	2003-03-06
Test circuit device capable of identifying error in stored data at memory cell level and semiconductor integrated circuit device including the same App 20030043664 - Haraguchi, Masaru ; et al.	2003-03-06
Test circuit capable of testing embedded memory with reliability App 20030018939 - Kinoshita, Mitsuya ; et al.	2003-01-23
Semiconductor memory device Grant 6,496,429 - Murai , et al. December 17, 2	2002-12-17
Semiconductor Memory Device App 20020131307 - Murai, Yasumitsu ; et al.	2002-09-19
Semiconductor memory device Grant 6,449,198 - Hamade , et al. September 10, 2	2002-09-10
Circuit for reducing test time and semiconductor memory device including the circuit App 20020056061 - Haraguchi, Masaru ; et al.	2002-05-09
Semiconductor device Grant 6,285,622 - Haraguchi , et al. September 4, 2	2001-09-04
Synchronous semiconductor integrated circuit capable of improving immunity from malfunctions Grant 6,240,045 - Haraguchi , et al. May 29, 2	2001-05-29