Patent | Date |
---|
Substrate processing apparatus and control method Grant 11,260,493 - Harada , et al. March 1, 2 | 2022-03-01 |
Defect observation device Grant 11,177,111 - Ito , et al. November 16, 2 | 2021-11-16 |
Sample observation device and sample observation method Grant 11,170,483 - Harada , et al. November 9, 2 | 2021-11-09 |
Defect observation device and defect observation method Grant 11,087,454 - Kondo , et al. August 10, 2 | 2021-08-10 |
Bone Plate And Bone Plate Kit App 20210177473 - KURODA; Koichi ;   et al. | 2021-06-17 |
Wafer observation device Grant 10,977,786 - Kondo , et al. April 13, 2 | 2021-04-13 |
Defect observation system and defect observation method for semiconductor wafer Grant 10,971,325 - Harada , et al. April 6, 2 | 2021-04-06 |
Wafer Observation Apparatus And Wafer Observation Method App 20200411345 - Kondo; Naoaki ;   et al. | 2020-12-31 |
Defect Observation Device App 20200335300 - ITO; Akira ;   et al. | 2020-10-22 |
Defect classification apparatus and defect classification method Grant 10,810,733 - Kondo , et al. October 20, 2 | 2020-10-20 |
Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI Grant 10,783,625 - Harada , et al. Sept | 2020-09-22 |
Sample Observation Device And Sample Observation Method App 20200126201 - HARADA; Minoru ;   et al. | 2020-04-23 |
Defect Observation System And Defect Observation Method For Semiconductor Wafer App 20200083017 - HARADA; Minoru ;   et al. | 2020-03-12 |
Sample observation device and sample observation method Grant 10,559,074 - Harada , et al. Feb | 2020-02-11 |
Defect Observation Device And Defect Observation Method App 20200034957 - KONDO; Naoaki ;   et al. | 2020-01-30 |
Simple electronic musical instrument, player's console and signal processing system incorporated therein Grant RE47,779 - Tanaka , et al. Dec | 2019-12-24 |
Wafer Observation Device App 20190266713 - KONDO; Naoaki ;   et al. | 2019-08-29 |
Substrate Processing Apparatus And Control Method App 20190217438 - Harada; Minoru ;   et al. | 2019-07-18 |
Defect Classification Apparatus And Defect Classification Method App 20190139210 - KONDO; Naoaki ;   et al. | 2019-05-09 |
Sample observation method and sample observation device Grant 10,229,812 - Harada , et al. | 2019-03-12 |
Defect classification apparatus and defect classification method Grant 10,203,851 - Minekawa , et al. Feb | 2019-02-12 |
Sample Observation Device And Sample Observation Method App 20180240225 - HARADA; Minoru ;   et al. | 2018-08-23 |
Defect Image Classification Device And Defect Image Classification Method App 20180174000 - TAKAGI; Yuji ;   et al. | 2018-06-21 |
Defect inspection method and defect inspection device Grant 9,922,414 - Takagi , et al. March 20, 2 | 2018-03-20 |
Method For Measuring Overlay And Measuring Apparatus, Scanning Electron Microscope, And Gui App 20180025482 - HARADA; Minoru ;   et al. | 2018-01-25 |
Sample Observation Method And Sample Observation Device App 20180019097 - HARADA; Minoru ;   et al. | 2018-01-18 |
Defect observation method and defect observation device Grant 9,811,897 - Harada , et al. November 7, 2 | 2017-11-07 |
Method for measuring overlay and measuring apparatus, scanning electron microscope, and GUI Grant 9,799,112 - Harada , et al. October 24, 2 | 2017-10-24 |
Gas-dissolved Water Production Device And Production Method App 20170282132 - OZAWA; Suguru ;   et al. | 2017-10-05 |
Defect observation method and defect observation device Grant 9,569,836 - Hirai , et al. February 14, 2 | 2017-02-14 |
Defect classification method, and defect classification system Grant 9,401,015 - Minekawa , et al. July 26, 2 | 2016-07-26 |
Method and device for testing defect using SEM Grant 9,390,490 - Takagi , et al. July 12, 2 | 2016-07-12 |
Method and apparatus for reviewing defect Grant 9,342,879 - Minekawa , et al. May 17, 2 | 2016-05-17 |
Inspection method and device therefor Grant 9,311,697 - Harada , et al. April 12, 2 | 2016-04-12 |
Defect Inspection Method And Defect Inspection Device App 20160019682 - TAKAGI; Yuji ;   et al. | 2016-01-21 |
Defect Observation Method And Defect Observation Device App 20150332445 - HARADA; Minoru ;   et al. | 2015-11-19 |
Defect Observation Method and Defect Observation Device App 20150302568 - HIRAI; Takehiro ;   et al. | 2015-10-22 |
Defect inspection method and defect inspection device Grant 9,165,356 - Harada , et al. October 20, 2 | 2015-10-20 |
Method For Measuring Overlay And Measuring Apparatus, Scanning Electron Microscope, And Gui App 20140375793 - Harada; Minoru ;   et al. | 2014-12-25 |
Gui, Classification Apparatus, Classification Method, Program, And Storage Medium Storing The Classification Program App 20140331173 - Minekawa; Yohei ;   et al. | 2014-11-06 |
Method and Apparatus for Reviewing Defect App 20140219546 - Minekawa; Yohei ;   et al. | 2014-08-07 |
Defect Inspection Method and Defect Inspection Device App 20140169657 - Harada; Minoru ;   et al. | 2014-06-19 |
Method and apparatus for reviewing defects Grant 8,731,275 - Harada , et al. May 20, 2 | 2014-05-20 |
Reviewed defect selection processing method, defect review method, reviewed defect selection processing tool, and defect review tool Grant 8,675,949 - Takagi , et al. March 18, 2 | 2014-03-18 |
Defect Classification Method, And Defect Classification System App 20140072204 - Minekawa; Yohei ;   et al. | 2014-03-13 |
Defect Review Method And Apparatus App 20140037188 - Nakagaki; Ryo ;   et al. | 2014-02-06 |
Defect observation method and defect observation apparatus Grant 8,634,634 - Harada , et al. January 21, 2 | 2014-01-21 |
Image Classification Method And Image Classification Apparatus App 20130294680 - Harada; Minoru ;   et al. | 2013-11-07 |
Defect review method and apparatus Grant 8,526,710 - Nakagaki , et al. September 3, 2 | 2013-09-03 |
Defect Classification System And Defect Classification Device And Imaging Device App 20130222574 - Nakagaki; Ryo ;   et al. | 2013-08-29 |
Method And Apparatus For Reviewing Defects App 20130114881 - HARADA; Minoru ;   et al. | 2013-05-09 |
Inspection Method And Device Therefor App 20130108147 - Harada; Minoru ;   et al. | 2013-05-02 |
Method And Device For Testing Defect Using Sem App 20130070078 - Takagi; Yuji ;   et al. | 2013-03-21 |
Method and apparatus for reviewing defects Grant 8,355,559 - Harada , et al. January 15, 2 | 2013-01-15 |
Method For Defect Inspection And Apparatus For Defect Inspection App 20120257041 - Nakagaki; Ryo ;   et al. | 2012-10-11 |
Reviewed Defect Selection Processing Method, Defect Review Method, Reviewed Defect Selection Processing Tool, And Defect Review Tool App 20120093392 - Takagi; Yuji ;   et al. | 2012-04-19 |
Method and its apparatus for reviewing defects Grant 8,121,397 - Harada , et al. February 21, 2 | 2012-02-21 |
Defect Observation Method And Defect Observation Apparatus App 20110299760 - Harada; Minoru ;   et al. | 2011-12-08 |
Defect Observation Device And Defect Observation Method App 20110261190 - Nakagaki; Ryo ;   et al. | 2011-10-27 |
Process for production of crystal of purine nucleoside compound Grant 8,034,924 - Naito , et al. October 11, 2 | 2011-10-11 |
Method and system for observing a specimen using a scanning electron microscope Grant 7,932,493 - Harada , et al. April 26, 2 | 2011-04-26 |
Electronic apparatus having security function Grant 7,865,935 - Harada , et al. January 4, 2 | 2011-01-04 |
Operation Support Apparatus, Operation Support Method And Computer Program App 20100333009 - Oshita; Isao ;   et al. | 2010-12-30 |
Process For Production Of Crystal Of Purine Nucleoside Compound App 20090326213 - NAITO; Masaki ;   et al. | 2009-12-31 |
Method And Apparatus For Reviewing Defects App 20090268959 - Harada; Minoru ;   et al. | 2009-10-29 |
Method And Its Apparatus For Reviewing Defects App 20090252403 - Harada; Minoru ;   et al. | 2009-10-08 |
Electronic percussion system and electronic percussion instrument incorporated therein Grant 7,569,758 - Harada , et al. August 4, 2 | 2009-08-04 |
Gas dissolved water producing apparatus and method thereof and ultrasonic cleaning equipment and method thereof App 20090139541 - Ozawa; Suguru ;   et al. | 2009-06-04 |
Defect review method and apparatus App 20090136121 - Nakagaki; Ryo ;   et al. | 2009-05-28 |
Method and system for observing a specimen using a scanning electron microscope App 20090084953 - Harada; Minoru ;   et al. | 2009-04-02 |
Method and its apparatus for reviewing defects App 20080298670 - Nakagaki; Ryo ;   et al. | 2008-12-04 |
Electronic apparatus having security function App 20070209079 - Harada; Minoru ;   et al. | 2007-09-06 |
Electronic apparatus having security function Grant 7,093,300 - Harada , et al. August 15, 2 | 2006-08-15 |
Power supply control device, apparatus equipped therewith and recording medium Grant 7,058,480 - Kawanishi , et al. June 6, 2 | 2006-06-06 |
Electronic apparatus having security function App 20050258960 - Harada, Minoru ;   et al. | 2005-11-24 |
Ozone generator Grant 6,932,946 - Shinjo , et al. August 23, 2 | 2005-08-23 |
Gas dissolved water producing apparatus and method thereof and ultrasonic cleaning equipment and method thereof Grant 6,921,063 - Ozawa , et al. July 26, 2 | 2005-07-26 |
Gas dissolved water producing apparatus and method thereof and ultrasonic cleaning equipment and method thereof App 20050150515 - Ozawa, Suguru ;   et al. | 2005-07-14 |
Simple electronic musical instrument, player's console and signal processing system incorporated therein Grant 6,753,467 - Tanaka , et al. June 22, 2 | 2004-06-22 |
Electronic percussion system and electronic percussion instrument incorporated therein App 20040025663 - Harada, Minoru ;   et al. | 2004-02-12 |
Gas dissolved water producing apparatus and method thereof and ultrasonic cleaning equipment and method thereof App 20040012104 - Ozawa, Suguru ;   et al. | 2004-01-22 |
Simple electronic musical instrument, player's console and signal processing system incorporated therein App 20030061932 - Tanaka, So ;   et al. | 2003-04-03 |
Ozone generator App 20020001550 - Shinjo, Ryoichi ;   et al. | 2002-01-03 |
Discharge reactor Grant 5,549,874 - Kamiya , et al. August 27, 1 | 1996-08-27 |
Double loop track system for railway freightyard and freight station Grant 3,889,603 - Harada June 17, 1 | 1975-06-17 |
Process For The Production Of Alloy Sponge Of Titanium Or Zirconium Base Metal By Mixing A Halide Of The Alloying Metal With Titanium Or Zirconium Tetrachloride And Simultaneously Reducing Grant 3,839,020 - Honma , et al. * October 1, 1 | 1974-10-01 |