| Patent | Date |
|---|
Cleaning liquid, cleaning method, and method for producing semiconductor wafer
Grant 11,149,231 - Harada , et al. October 19, 2 | 2021-10-19 |
Assembly Method Using Assembly Tool
App 20210305593 - HARADA; Ken ; et al. | 2021-09-30 |
Electron Microscope And Sample Observation Method Using The Same
App 20210233741 - Harada; Ken ; et al. | 2021-07-29 |
Cleaning agent composition for semiconductor device substrate, method of cleaning semiconductor device substrate, method of manufacturing semiconductor device substrate, and semiconductor device substrate
Grant 11,066,627 - Kusano , et al. July 20, 2 | 2021-07-20 |
Cleaning Liquid, Cleaning Method, And Method For Producing Semiconductor Wafer
App 20210171878 - SHIBATA; Toshiaki ; et al. | 2021-06-10 |
Holography reconstruction method and program
Grant 11,024,482 - Harada , et al. June 1, 2 | 2021-06-01 |
Shape Correction Device For Frame Body, And Method For Manufacturing Electrolyte Film/electrode Structure Provided With Resin Frame For Fuel Cell
App 20210151827 - Harada; Ken ; et al. | 2021-05-20 |
Interferometric electron microscope
Grant 11,011,344 - Tanigaki , et al. May 18, 2 | 2021-05-18 |
Particle beam device, observation method, and diffraction grating
Grant 10,948,426 - Harada , et al. March 16, 2 | 2021-03-16 |
Interference optical system unit, charged particle beam interference apparatus, and method for observing charged particle beam interference image
Grant 10,770,264 - Iwasaki , et al. Sep | 2020-09-08 |
Interferometric Electron Microscope
App 20200273657 - TANIGAKI; Toshiaki ; et al. | 2020-08-27 |
Cleaning Liquid, Cleaning Method, And Method For Producing Semiconductor Wafer
App 20200231900 - HARADA; Ken ; et al. | 2020-07-23 |
Holography Reconstruction Method And Program
App 20200105498 - HARADA; Ken ; et al. | 2020-04-02 |
Electron microscope and imaging method
Grant 10,535,497 - Tamaki , et al. Ja | 2020-01-14 |
Cleaning Agent Composition For Semiconductor Device Substrate, Method Of Cleaning Semiconductor Device Substrate, Method Of Manu
App 20200002652 - KUSANO; Tomohiro ; et al. | 2020-01-02 |
Interference Optical System Unit, Charged Particle Beam Interference Apparatus, And Method For Observing Charged Particle Beam I
App 20190295816 - IWASAKI; Yoh ; et al. | 2019-09-26 |
Particle Beam Device, Observation Method, And Diffraction Grating
App 20190196070 - HARADA; Ken ; et al. | 2019-06-27 |
Electron Microscope And Imaging Method
App 20190131107 - TAMAKI; Hirokazu ; et al. | 2019-05-02 |
Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating
Grant 10,210,962 - Harada , et al. Feb | 2019-02-19 |
Cleaning liquid for semiconductor device and method for cleaning substrate for semiconductor device
Grant 10,113,141 - Harada , et al. October 30, 2 | 2018-10-30 |
Zone plate having annular or spiral shape and Y-shaped branching edge dislocation
Grant 9,864,114 - Harada , et al. January 9, 2 | 2018-01-09 |
Charged Particle Beam Device, Optical Device, Irradiation Method, Diffraction Grating System, And Diffraction Grating
App 20170194065 - HARADA; Ken ; et al. | 2017-07-06 |
Electron microscope
Grant 9,679,738 - Matsumoto , et al. June 13, 2 | 2017-06-13 |
Electron Microscope
App 20160196952 - MATSUMOTO; Hiroaki ; et al. | 2016-07-07 |
Cleaning liquid for semiconductor device substrates and method of cleaning substrate for semiconductor devices
Grant 9,365,802 - Harada , et al. June 14, 2 | 2016-06-14 |
Electron beam interference device and electron beam interferometry
Grant 8,946,628 - Harada , et al. February 3, 2 | 2015-02-03 |
Cleaning Liquid For Semiconductor Device And Method For Cleaning Substrate For Semiconductor Device
App 20140371124 - HARADA; Ken ; et al. | 2014-12-18 |
Electron Beam Interference Device and Electron Beam Interferometry
App 20140332684 - Harada; Ken ; et al. | 2014-11-13 |
Zone Plate
App 20140204463 - Harada; Ken ; et al. | 2014-07-24 |
Interference electron microscope
Grant 8,785,851 - Tanigaki , et al. July 22, 2 | 2014-07-22 |
Electron Microscope And Sample Observation Method
App 20140197312 - Harada; Ken | 2014-07-17 |
Electron beam device including a first electron biprism to split an electron beam into two beams and a second electron biprism in the image forming lens system to superpose the two beams
Grant 8,772,715 - Tanigaki , et al. July 8, 2 | 2014-07-08 |
Electromagnetic field application system
Grant 8,653,472 - Harada , et al. February 18, 2 | 2014-02-18 |
Interference Electron Microscope
App 20130313432 - TANIGAKI; Toshiaki ; et al. | 2013-11-28 |
Electron Beam Device
App 20130284925 - TANIGAKI; Toshiaki ; et al. | 2013-10-31 |
Cleaning Liquid For Semiconductor Device Substrates And Cleaning Method
App 20130225464 - HARADA; Ken ; et al. | 2013-08-29 |
Cleaning Liquid For Semiconductor Device Substrates And Method Of Cleaning Substrate For Semiconductor Devices
App 20130174867 - HARADA; Ken ; et al. | 2013-07-11 |
Laminated Body Manufacturing Apparatus, And Laminated Body Manufacturing Method
App 20130160622 - Shigematsu; Hideki ; et al. | 2013-06-27 |
Electron Beam Biprism Device and Electron Beam Device
App 20120241612 - Harada; Ken ; et al. | 2012-09-27 |
Transmission electron microscope and method for observing specimen image with the same
Grant 8,193,494 - Harada , et al. June 5, 2 | 2012-06-05 |
Thick film resistor
Grant 7,999,652 - Harada , et al. August 16, 2 | 2011-08-16 |
Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method
Grant 7,939,801 - Kasai , et al. May 10, 2 | 2011-05-10 |
Electron beam device
Grant 7,923,685 - Harada , et al. April 12, 2 | 2011-04-12 |
Electromagentic Field Application System
App 20110073759 - HARADA; Ken ; et al. | 2011-03-31 |
Transmission Electron Microscope And Method For Observing Specimen Image With The Same
App 20110031395 - Harada; Ken ; et al. | 2011-02-10 |
Interferometer
Grant 7,872,755 - Harada , et al. January 18, 2 | 2011-01-18 |
Electron interferometer or electron microscope
Grant 7,816,648 - Harada , et al. October 19, 2 | 2010-10-19 |
Magnetization state control device and magnetic information recording device
Grant 7,808,814 - Togawa , et al. October 5, 2 | 2010-10-05 |
Interferometer having three electron biprisms
Grant 7,750,298 - Harada , et al. July 6, 2 | 2010-07-06 |
Charged particle beam equipment
Grant 7,655,905 - Harada , et al. February 2, 2 | 2010-02-02 |
Interferometer
App 20090273789 - Harada; Ken ; et al. | 2009-11-05 |
Electron Beam Device
App 20090206256 - HARADA; Ken ; et al. | 2009-08-20 |
Electron Beam Observation Device Using Pre-specimen Magnetic Field As Image-forming Lens And Specimen Observation Method
App 20090206258 - KASAI; Hiroto ; et al. | 2009-08-20 |
Thick Film Resistor
App 20090174523 - HARADA; Ken ; et al. | 2009-07-09 |
Interferometer
Grant 7,538,323 - Harada , et al. May 26, 2 | 2009-05-26 |
Charged particle beam equipment
App 20090045339 - Harada; Ken ; et al. | 2009-02-19 |
Magnetization state control device and magnetic information recording device
App 20090021866 - Togawa; Yoshihiko ; et al. | 2009-01-22 |
Electron Interferometer or Electron Microscope
App 20080302965 - Harada; Ken ; et al. | 2008-12-11 |
Interferometer
App 20080258058 - Harada; Ken ; et al. | 2008-10-23 |
Interferometer
App 20070272861 - Harada; Ken ; et al. | 2007-11-29 |
Manufacturing method of product having sprayed coating film
Grant 6,863,931 - Someno , et al. March 8, 2 | 2005-03-08 |
Specimen observation system for applying external magnetic field
Grant 6,838,675 - Harada , et al. January 4, 2 | 2005-01-04 |
Magnetic field applying sample observing system
App 20040061066 - Harada, Ken ; et al. | 2004-04-01 |
Manufacturing method of product having sprayed coating film
App 20030152699 - Someno, Shinji ; et al. | 2003-08-14 |
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